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Investigation into massloading sensitivity of typical resonant structures attached to SAW Sensors
Recently there is greater interest in employing high aspect ratio resonant structures such as nano-pillars as sensing medium in SAW Sensors. In this work we have performed finite element method (FEM) simulation of a SAW device attached with typical resonant nano-pillars and studied the resonance fre...
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creator | Kashan, M. A. M. Ramakrishnan, N. |
description | Recently there is greater interest in employing high aspect ratio resonant structures such as nano-pillars as sensing medium in SAW Sensors. In this work we have performed finite element method (FEM) simulation of a SAW device attached with typical resonant nano-pillars and studied the resonance frequency shift sensitivity caused by change in the Young's modulus (E) and density (ρ) of the pillars. It is observed that the resonance frequency shift depends on the combined loading effect of E and ρ of the pillars. For an increase in E of the pillars, elastic loading dominates over inertial loading caused by ρ, accordingly an increase in resonance frequency of the SAW device is observed and vice versa. The results also show that nano-pillars made of hard polymers such as SU-8 show higher sensitivity for change in E or ρ. |
doi_str_mv | 10.1109/ICSensT.2012.6461737 |
format | conference_proceeding |
fullrecord | <record><control><sourceid>ieee_6IE</sourceid><recordid>TN_cdi_ieee_primary_6461737</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><ieee_id>6461737</ieee_id><sourcerecordid>6461737</sourcerecordid><originalsourceid>FETCH-LOGICAL-i175t-7d48c74f420748afdd2570f8dbf8c4002f911780aea0f1896e3f62a1b72962a3</originalsourceid><addsrcrecordid>eNo9kN1qAjEUhNM_qLU-QXuRF1h7TpJNspci_RGEXij0Uo67iU3RrGyi4Nt3S22vhmHgm2EYe0QYI0L1NJsuXEzLsQAUY600Gmku2B0qbaQQqrSXbCCw1IUFI6_YqDL2L9N4_Z_p8paNUvoCANRWyMoOGM3i0aUcNpRDG3mIueU7SmnbUhPihqe-OORwDPnEW8_zaR9q2vLOpTZSzDzl7lDnQ-855Uz1p2t4j1hMPvjP5rZL9-zG0za50VmHbPnyvJy-FfP319l0Mi8CmjIXplG2NsorAUZZ8k0jSgPeNmtvawUgfIVoLJAj8Ggr7aTXgnBtRNWrHLKHX2xwzq32XdhRd1qdz5Lf47pcWg</addsrcrecordid><sourcetype>Publisher</sourcetype><iscdi>true</iscdi><recordtype>conference_proceeding</recordtype></control><display><type>conference_proceeding</type><title>Investigation into massloading sensitivity of typical resonant structures attached to SAW Sensors</title><source>IEEE Electronic Library (IEL) Conference Proceedings</source><creator>Kashan, M. A. M. ; Ramakrishnan, N.</creator><creatorcontrib>Kashan, M. A. M. ; Ramakrishnan, N.</creatorcontrib><description>Recently there is greater interest in employing high aspect ratio resonant structures such as nano-pillars as sensing medium in SAW Sensors. In this work we have performed finite element method (FEM) simulation of a SAW device attached with typical resonant nano-pillars and studied the resonance frequency shift sensitivity caused by change in the Young's modulus (E) and density (ρ) of the pillars. It is observed that the resonance frequency shift depends on the combined loading effect of E and ρ of the pillars. For an increase in E of the pillars, elastic loading dominates over inertial loading caused by ρ, accordingly an increase in resonance frequency of the SAW device is observed and vice versa. The results also show that nano-pillars made of hard polymers such as SU-8 show higher sensitivity for change in E or ρ.</description><identifier>ISSN: 2156-8065</identifier><identifier>ISBN: 9781467322461</identifier><identifier>ISBN: 1467322466</identifier><identifier>EISSN: 2156-8073</identifier><identifier>EISBN: 1467322458</identifier><identifier>EISBN: 9781467322485</identifier><identifier>EISBN: 1467322482</identifier><identifier>EISBN: 9781467322454</identifier><identifier>DOI: 10.1109/ICSensT.2012.6461737</identifier><language>eng</language><publisher>IEEE</publisher><subject>FEM ; High Sensitivity Sensors ; Loading ; Mass loading ; Materials ; Nano-pillars ; Resonant frequency ; SAW Sensor ; Sensitivity ; Sensors ; Surface acoustic wave devices ; Surface acoustic waves</subject><ispartof>2012 Sixth International Conference on Sensing Technology (ICST), 2012, p.538-542</ispartof><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://ieeexplore.ieee.org/document/6461737$$EHTML$$P50$$Gieee$$H</linktohtml><link.rule.ids>309,310,780,784,789,790,2058,27925,54555,54920,54932</link.rule.ids><linktorsrc>$$Uhttps://ieeexplore.ieee.org/document/6461737$$EView_record_in_IEEE$$FView_record_in_$$GIEEE</linktorsrc></links><search><creatorcontrib>Kashan, M. A. M.</creatorcontrib><creatorcontrib>Ramakrishnan, N.</creatorcontrib><title>Investigation into massloading sensitivity of typical resonant structures attached to SAW Sensors</title><title>2012 Sixth International Conference on Sensing Technology (ICST)</title><addtitle>ICSensT</addtitle><description>Recently there is greater interest in employing high aspect ratio resonant structures such as nano-pillars as sensing medium in SAW Sensors. In this work we have performed finite element method (FEM) simulation of a SAW device attached with typical resonant nano-pillars and studied the resonance frequency shift sensitivity caused by change in the Young's modulus (E) and density (ρ) of the pillars. It is observed that the resonance frequency shift depends on the combined loading effect of E and ρ of the pillars. For an increase in E of the pillars, elastic loading dominates over inertial loading caused by ρ, accordingly an increase in resonance frequency of the SAW device is observed and vice versa. The results also show that nano-pillars made of hard polymers such as SU-8 show higher sensitivity for change in E or ρ.</description><subject>FEM</subject><subject>High Sensitivity Sensors</subject><subject>Loading</subject><subject>Mass loading</subject><subject>Materials</subject><subject>Nano-pillars</subject><subject>Resonant frequency</subject><subject>SAW Sensor</subject><subject>Sensitivity</subject><subject>Sensors</subject><subject>Surface acoustic wave devices</subject><subject>Surface acoustic waves</subject><issn>2156-8065</issn><issn>2156-8073</issn><isbn>9781467322461</isbn><isbn>1467322466</isbn><isbn>1467322458</isbn><isbn>9781467322485</isbn><isbn>1467322482</isbn><isbn>9781467322454</isbn><fulltext>true</fulltext><rsrctype>conference_proceeding</rsrctype><creationdate>2012</creationdate><recordtype>conference_proceeding</recordtype><sourceid>6IE</sourceid><recordid>eNo9kN1qAjEUhNM_qLU-QXuRF1h7TpJNspci_RGEXij0Uo67iU3RrGyi4Nt3S22vhmHgm2EYe0QYI0L1NJsuXEzLsQAUY600Gmku2B0qbaQQqrSXbCCw1IUFI6_YqDL2L9N4_Z_p8paNUvoCANRWyMoOGM3i0aUcNpRDG3mIueU7SmnbUhPihqe-OORwDPnEW8_zaR9q2vLOpTZSzDzl7lDnQ-855Uz1p2t4j1hMPvjP5rZL9-zG0za50VmHbPnyvJy-FfP319l0Mi8CmjIXplG2NsorAUZZ8k0jSgPeNmtvawUgfIVoLJAj8Ggr7aTXgnBtRNWrHLKHX2xwzq32XdhRd1qdz5Lf47pcWg</recordid><startdate>201212</startdate><enddate>201212</enddate><creator>Kashan, M. A. M.</creator><creator>Ramakrishnan, N.</creator><general>IEEE</general><scope>6IE</scope><scope>6IL</scope><scope>CBEJK</scope><scope>RIE</scope><scope>RIL</scope></search><sort><creationdate>201212</creationdate><title>Investigation into massloading sensitivity of typical resonant structures attached to SAW Sensors</title><author>Kashan, M. A. M. ; Ramakrishnan, N.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-i175t-7d48c74f420748afdd2570f8dbf8c4002f911780aea0f1896e3f62a1b72962a3</frbrgroupid><rsrctype>conference_proceedings</rsrctype><prefilter>conference_proceedings</prefilter><language>eng</language><creationdate>2012</creationdate><topic>FEM</topic><topic>High Sensitivity Sensors</topic><topic>Loading</topic><topic>Mass loading</topic><topic>Materials</topic><topic>Nano-pillars</topic><topic>Resonant frequency</topic><topic>SAW Sensor</topic><topic>Sensitivity</topic><topic>Sensors</topic><topic>Surface acoustic wave devices</topic><topic>Surface acoustic waves</topic><toplevel>online_resources</toplevel><creatorcontrib>Kashan, M. A. M.</creatorcontrib><creatorcontrib>Ramakrishnan, N.</creatorcontrib><collection>IEEE Electronic Library (IEL) Conference Proceedings</collection><collection>IEEE Proceedings Order Plan All Online (POP All Online) 1998-present by volume</collection><collection>IEEE Xplore All Conference Proceedings</collection><collection>IEL</collection><collection>IEEE Proceedings Order Plans (POP All) 1998-Present</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Kashan, M. A. M.</au><au>Ramakrishnan, N.</au><format>book</format><genre>proceeding</genre><ristype>CONF</ristype><atitle>Investigation into massloading sensitivity of typical resonant structures attached to SAW Sensors</atitle><btitle>2012 Sixth International Conference on Sensing Technology (ICST)</btitle><stitle>ICSensT</stitle><date>2012-12</date><risdate>2012</risdate><spage>538</spage><epage>542</epage><pages>538-542</pages><issn>2156-8065</issn><eissn>2156-8073</eissn><isbn>9781467322461</isbn><isbn>1467322466</isbn><eisbn>1467322458</eisbn><eisbn>9781467322485</eisbn><eisbn>1467322482</eisbn><eisbn>9781467322454</eisbn><abstract>Recently there is greater interest in employing high aspect ratio resonant structures such as nano-pillars as sensing medium in SAW Sensors. In this work we have performed finite element method (FEM) simulation of a SAW device attached with typical resonant nano-pillars and studied the resonance frequency shift sensitivity caused by change in the Young's modulus (E) and density (ρ) of the pillars. It is observed that the resonance frequency shift depends on the combined loading effect of E and ρ of the pillars. For an increase in E of the pillars, elastic loading dominates over inertial loading caused by ρ, accordingly an increase in resonance frequency of the SAW device is observed and vice versa. The results also show that nano-pillars made of hard polymers such as SU-8 show higher sensitivity for change in E or ρ.</abstract><pub>IEEE</pub><doi>10.1109/ICSensT.2012.6461737</doi><tpages>5</tpages></addata></record> |
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subjects | FEM High Sensitivity Sensors Loading Mass loading Materials Nano-pillars Resonant frequency SAW Sensor Sensitivity Sensors Surface acoustic wave devices Surface acoustic waves |
title | Investigation into massloading sensitivity of typical resonant structures attached to SAW Sensors |
url | http://sfxeu10.hosted.exlibrisgroup.com/loughborough?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-05T02%3A49%3A17IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-ieee_6IE&rft_val_fmt=info:ofi/fmt:kev:mtx:book&rft.genre=proceeding&rft.atitle=Investigation%20into%20massloading%20sensitivity%20of%20typical%20resonant%20structures%20attached%20to%20SAW%20Sensors&rft.btitle=2012%20Sixth%20International%20Conference%20on%20Sensing%20Technology%20(ICST)&rft.au=Kashan,%20M.%20A.%20M.&rft.date=2012-12&rft.spage=538&rft.epage=542&rft.pages=538-542&rft.issn=2156-8065&rft.eissn=2156-8073&rft.isbn=9781467322461&rft.isbn_list=1467322466&rft_id=info:doi/10.1109/ICSensT.2012.6461737&rft.eisbn=1467322458&rft.eisbn_list=9781467322485&rft.eisbn_list=1467322482&rft.eisbn_list=9781467322454&rft_dat=%3Cieee_6IE%3E6461737%3C/ieee_6IE%3E%3Cgrp_id%3Ecdi_FETCH-LOGICAL-i175t-7d48c74f420748afdd2570f8dbf8c4002f911780aea0f1896e3f62a1b72962a3%3C/grp_id%3E%3Coa%3E%3C/oa%3E%3Curl%3E%3C/url%3E&rft_id=info:oai/&rft_id=info:pmid/&rft_ieee_id=6461737&rfr_iscdi=true |