SEU simulation by fault injection in PSoC device: Preliminary results

In this paper the consequences of SEU (Single Event Upset) faults on System on Chip devices (SOC) are studied. A PSOC microcontroller CY8C27643 manufactured by Cypress was chosen as a test vehicle. Fault injection sessions were performed using the so-called (Code Emulated Upset) approach in two diff...

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Bibliographic Details
Main Authors: Mansour, W., Velazco, R., El Falou, W., Ziade, H., Ayoubi, R.
Format: Conference Proceeding
Language:English
Subjects:
Benchmark testing
Circuit faults
Code Emulated Upset (CEU)
fault injection
Field programmable gate arrays
Microcontrollers
PSOC
Registers
Single Event Effects (SEU)
Single event upset
System On Chip (SOC)
System-on-a-chip
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Summary:In this paper the consequences of SEU (Single Event Upset) faults on System on Chip devices (SOC) are studied. A PSOC microcontroller CY8C27643 manufactured by Cypress was chosen as a test vehicle. Fault injection sessions were performed using the so-called (Code Emulated Upset) approach in two different HW/SW environments. Obtained results put in evidence the potentially critical consequences of some of the faults occurring in the digital blocks when a matrix multiplication benchmark is being executed.
DOI:10.1109/ICTEA.2012.6462894