Soft errors in advanced CMOS technologies

Soft errors produced by ionizing radiation pose significant challenges for integrated circuits and electronic devices. The challenges and solutions change significantly as feature sizes become smaller and device topologies change. This paper reviews soft errors in advanced electronics, with emphasis...

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Bibliographic Details
Main Authors: Schrimpf, R. D., Alles, M. A., Mamouni, F. E., Fleetwood, D. M., Weller, R. A., Reed, R. A.
Format: Conference Proceeding
Language:English
Subjects:
CMOS integrated circuits
CMOS technology
Error analysis
FinFETs
Logic gates
Substrates
Transient analysis
Online Access:Request full text
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Summary:Soft errors produced by ionizing radiation pose significant challenges for integrated circuits and electronic devices. The challenges and solutions change significantly as feature sizes become smaller and device topologies change. This paper reviews soft errors in advanced electronics, with emphasis on highly scaled CMOS technologies.
DOI:10.1109/ICSICT.2012.6467689