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Replacement of electrical (load) drives by a hardware-in-the-loop system
This paper presents an interesting approach for hardware-in-the-loop testing of voltage source inverters for drive applications. For this purpose the inverter under test is not connected to a real machine, but to a second inverter instead, which behaves like an electrical machine. The power capabili...
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creator | Kennel, R. M. Boller, T. Holtz, J. |
description | This paper presents an interesting approach for hardware-in-the-loop testing of voltage source inverters for drive applications. For this purpose the inverter under test is not connected to a real machine, but to a second inverter instead, which behaves like an electrical machine. The power capability of the so-called "Virtual Machine" is increased by sequential switching of parallel connected standard inverters. The parallel connected inverters can be of the same type as the inverter under test. Hence there exists no power limit for drive inverter testing with respect to the product range of the manufacturer. |
doi_str_mv | 10.1109/ACEMP.2011.6490562 |
format | conference_proceeding |
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M. ; Boller, T. ; Holtz, J.</creator><creatorcontrib>Kennel, R. M. ; Boller, T. ; Holtz, J.</creatorcontrib><description>This paper presents an interesting approach for hardware-in-the-loop testing of voltage source inverters for drive applications. For this purpose the inverter under test is not connected to a real machine, but to a second inverter instead, which behaves like an electrical machine. The power capability of the so-called "Virtual Machine" is increased by sequential switching of parallel connected standard inverters. The parallel connected inverters can be of the same type as the inverter under test. Hence there exists no power limit for drive inverter testing with respect to the product range of the manufacturer.</description><identifier>ISBN: 1467350044</identifier><identifier>ISBN: 9781467350044</identifier><identifier>EISBN: 1467350036</identifier><identifier>EISBN: 9781467350020</identifier><identifier>EISBN: 9781467350037</identifier><identifier>EISBN: 1467350028</identifier><identifier>DOI: 10.1109/ACEMP.2011.6490562</identifier><language>eng</language><publisher>IEEE</publisher><subject>electronic load ; hardware-in-the-loop ; PHiL ; power electronics testing ; sequential switching ; VSI</subject><ispartof>International Aegean Conference on Electrical Machines and Power Electronics and Electromotion, Joint Conference, 2011, p.17-25</ispartof><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c224t-985056a454d241ae6d0612192c3b6b7ab559bb72d663f70ddd57ca1d5e69a8f73</citedby></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://ieeexplore.ieee.org/document/6490562$$EHTML$$P50$$Gieee$$H</linktohtml><link.rule.ids>309,310,780,784,789,790,2058,27925,54920</link.rule.ids><linktorsrc>$$Uhttps://ieeexplore.ieee.org/document/6490562$$EView_record_in_IEEE$$FView_record_in_$$GIEEE</linktorsrc></links><search><creatorcontrib>Kennel, R. M.</creatorcontrib><creatorcontrib>Boller, T.</creatorcontrib><creatorcontrib>Holtz, J.</creatorcontrib><title>Replacement of electrical (load) drives by a hardware-in-the-loop system</title><title>International Aegean Conference on Electrical Machines and Power Electronics and Electromotion, Joint Conference</title><addtitle>ACEMP</addtitle><description>This paper presents an interesting approach for hardware-in-the-loop testing of voltage source inverters for drive applications. For this purpose the inverter under test is not connected to a real machine, but to a second inverter instead, which behaves like an electrical machine. The power capability of the so-called "Virtual Machine" is increased by sequential switching of parallel connected standard inverters. The parallel connected inverters can be of the same type as the inverter under test. Hence there exists no power limit for drive inverter testing with respect to the product range of the manufacturer.</description><subject>electronic load</subject><subject>hardware-in-the-loop</subject><subject>PHiL</subject><subject>power electronics testing</subject><subject>sequential switching</subject><subject>VSI</subject><isbn>1467350044</isbn><isbn>9781467350044</isbn><isbn>1467350036</isbn><isbn>9781467350020</isbn><isbn>9781467350037</isbn><isbn>1467350028</isbn><fulltext>true</fulltext><rsrctype>conference_proceeding</rsrctype><creationdate>2011</creationdate><recordtype>conference_proceeding</recordtype><sourceid>6IE</sourceid><recordid>eNpFj01Lw0AURUdEUGv_gG5mqYuJ853MsoTWChVFdF3ezLzQSNKUmaDk31uw4Opy4XA5l5BbwQshuHtc1MuXt0JyIQqrHTdWnpFroW2pDOfKnv8XrS_JPOcvzo8wt5Wursj6HQ8dBOxxP9KhodhhGFMboKP33QDxgcbUfmOmfqJAd5DiDyRk7Z6NO2TdMBxonvKI_Q25aKDLOD_ljHyulh_1mm1en57rxYYFKfXIXGWOiqCNjlILQBu5FVI4GZS3vgRvjPO-lNFa1ZQ8xmjKACIatA6qplQzcve32yLi9pDaHtK0PT1Xv3puTAY</recordid><startdate>201109</startdate><enddate>201109</enddate><creator>Kennel, R. M.</creator><creator>Boller, T.</creator><creator>Holtz, J.</creator><general>IEEE</general><scope>6IE</scope><scope>6IL</scope><scope>CBEJK</scope><scope>RIE</scope><scope>RIL</scope></search><sort><creationdate>201109</creationdate><title>Replacement of electrical (load) drives by a hardware-in-the-loop system</title><author>Kennel, R. M. ; Boller, T. ; Holtz, J.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c224t-985056a454d241ae6d0612192c3b6b7ab559bb72d663f70ddd57ca1d5e69a8f73</frbrgroupid><rsrctype>conference_proceedings</rsrctype><prefilter>conference_proceedings</prefilter><language>eng</language><creationdate>2011</creationdate><topic>electronic load</topic><topic>hardware-in-the-loop</topic><topic>PHiL</topic><topic>power electronics testing</topic><topic>sequential switching</topic><topic>VSI</topic><toplevel>online_resources</toplevel><creatorcontrib>Kennel, R. M.</creatorcontrib><creatorcontrib>Boller, T.</creatorcontrib><creatorcontrib>Holtz, J.</creatorcontrib><collection>IEEE Electronic Library (IEL) Conference Proceedings</collection><collection>IEEE Proceedings Order Plan All Online (POP All Online) 1998-present by volume</collection><collection>IEEE Xplore All Conference Proceedings</collection><collection>IEEE Xplore</collection><collection>IEEE Proceedings Order Plans (POP All) 1998-Present</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Kennel, R. M.</au><au>Boller, T.</au><au>Holtz, J.</au><format>book</format><genre>proceeding</genre><ristype>CONF</ristype><atitle>Replacement of electrical (load) drives by a hardware-in-the-loop system</atitle><btitle>International Aegean Conference on Electrical Machines and Power Electronics and Electromotion, Joint Conference</btitle><stitle>ACEMP</stitle><date>2011-09</date><risdate>2011</risdate><spage>17</spage><epage>25</epage><pages>17-25</pages><isbn>1467350044</isbn><isbn>9781467350044</isbn><eisbn>1467350036</eisbn><eisbn>9781467350020</eisbn><eisbn>9781467350037</eisbn><eisbn>1467350028</eisbn><abstract>This paper presents an interesting approach for hardware-in-the-loop testing of voltage source inverters for drive applications. For this purpose the inverter under test is not connected to a real machine, but to a second inverter instead, which behaves like an electrical machine. The power capability of the so-called "Virtual Machine" is increased by sequential switching of parallel connected standard inverters. The parallel connected inverters can be of the same type as the inverter under test. Hence there exists no power limit for drive inverter testing with respect to the product range of the manufacturer.</abstract><pub>IEEE</pub><doi>10.1109/ACEMP.2011.6490562</doi><tpages>9</tpages></addata></record> |
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ispartof | International Aegean Conference on Electrical Machines and Power Electronics and Electromotion, Joint Conference, 2011, p.17-25 |
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language | eng |
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source | IEEE Electronic Library (IEL) Conference Proceedings |
subjects | electronic load hardware-in-the-loop PHiL power electronics testing sequential switching VSI |
title | Replacement of electrical (load) drives by a hardware-in-the-loop system |
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