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Transient photoconductivity measurements of amorphous semiconductors by subnanosecond nitrogen lasers
Picosecond N 2 lasers characterized with ultra-short pulse-width, high peak power, and simple detection installation are found very useful in diagnosing carrier behaviors of amorphous semiconductors which have low-drift mobility and a short lifetime. An impedance-matched sample holder and a fast ris...
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Published in: | IEEE transactions on instrumentation and measurement 1986-09, Vol.IM-35 (3), p.354-357 |
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container_end_page | 357 |
container_issue | 3 |
container_start_page | 354 |
container_title | IEEE transactions on instrumentation and measurement |
container_volume | IM-35 |
creator | Lue, Juh Tzeng Tzeng, Chin-Ching |
description | Picosecond N 2 lasers characterized with ultra-short pulse-width, high peak power, and simple detection installation are found very useful in diagnosing carrier behaviors of amorphous semiconductors which have low-drift mobility and a short lifetime. An impedance-matched sample holder and a fast rise-time preamplifier designed in this work provide this system with a high immunity to the background noise during the N 2 laser discharge. |
doi_str_mv | 10.1109/TIM.1986.6499224 |
format | article |
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An impedance-matched sample holder and a fast rise-time preamplifier designed in this work provide this system with a high immunity to the background noise during the N 2 laser discharge.</description><identifier>ISSN: 0018-9456</identifier><identifier>EISSN: 1557-9662</identifier><identifier>DOI: 10.1109/TIM.1986.6499224</identifier><identifier>CODEN: IEIMAO</identifier><language>eng</language><publisher>New York, NY: IEEE</publisher><subject>Condensed matter: electronic structure, electrical, magnetic, and optical properties ; Electronic transport in condensed matter ; Exact sciences and technology ; Impedance ; Laser noise ; Measurement by laser beam ; Photoconduction and photovoltaic effects; photodielectric effects ; Photoconductivity ; Physics ; Semiconductor device measurement ; Transient analysis ; Transmission line measurements</subject><ispartof>IEEE transactions on instrumentation and measurement, 1986-09, Vol.IM-35 (3), p.354-357</ispartof><rights>1987 INIST-CNRS</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://ieeexplore.ieee.org/document/6499224$$EHTML$$P50$$Gieee$$H</linktohtml><link.rule.ids>314,780,784,27924,27925,54796</link.rule.ids><backlink>$$Uhttp://pascal-francis.inist.fr/vibad/index.php?action=getRecordDetail&idt=8169736$$DView record in Pascal Francis$$Hfree_for_read</backlink></links><search><creatorcontrib>Lue, Juh Tzeng</creatorcontrib><creatorcontrib>Tzeng, Chin-Ching</creatorcontrib><title>Transient photoconductivity measurements of amorphous semiconductors by subnanosecond nitrogen lasers</title><title>IEEE transactions on instrumentation and measurement</title><addtitle>TIM</addtitle><description>Picosecond N 2 lasers characterized with ultra-short pulse-width, high peak power, and simple detection installation are found very useful in diagnosing carrier behaviors of amorphous semiconductors which have low-drift mobility and a short lifetime. An impedance-matched sample holder and a fast rise-time preamplifier designed in this work provide this system with a high immunity to the background noise during the N 2 laser discharge.</description><subject>Condensed matter: electronic structure, electrical, magnetic, and optical properties</subject><subject>Electronic transport in condensed matter</subject><subject>Exact sciences and technology</subject><subject>Impedance</subject><subject>Laser noise</subject><subject>Measurement by laser beam</subject><subject>Photoconduction and photovoltaic effects; photodielectric effects</subject><subject>Photoconductivity</subject><subject>Physics</subject><subject>Semiconductor device measurement</subject><subject>Transient analysis</subject><subject>Transmission line measurements</subject><issn>0018-9456</issn><issn>1557-9662</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>1986</creationdate><recordtype>article</recordtype><recordid>eNo9kDtPwzAUhS0EEqWwI7F4YE2xndiOR1TxqFTEUubIjxswauLKN0HqvydVC9OV7vnOGT5CbjlbcM7Mw2b1tuCmVgtVGSNEdUZmXEpdGKXEOZkxxuvCVFJdkivEb8aYVpWeEdhk22OEfqC7rzQkn_ow-iH-xGFPO7A4ZuimFGlqqe1SnqgRKUIXT2jKSN2e4uh62yeEw5v2ccjpE3q6tQgZr8lFa7cIN6c7Jx_PT5vla7F-f1ktH9eFF1U5FMFYL7RiVgsN4EMQIQTJjAHFhSutci0D6VrpnNSyFsClLb2raiFDy1tXzgk77vqcEDO0zS7HzuZ9w1lz0NRMmpqDpuakaarcHys7i95u20mHj_jfq7kyulQTdnfEIgD8p38jv_ohdWY</recordid><startdate>19860901</startdate><enddate>19860901</enddate><creator>Lue, Juh Tzeng</creator><creator>Tzeng, Chin-Ching</creator><general>IEEE</general><general>Institute of Electrical and Electronics Engineers</general><scope>IQODW</scope><scope>AAYXX</scope><scope>CITATION</scope></search><sort><creationdate>19860901</creationdate><title>Transient photoconductivity measurements of amorphous semiconductors by subnanosecond nitrogen lasers</title><author>Lue, Juh Tzeng ; Tzeng, Chin-Ching</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c243t-d9ac2760a727eecdd2ddd5099e612b3a6bf0e5bf5bb57582e15a3cb4825df1fb3</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>1986</creationdate><topic>Condensed matter: electronic structure, electrical, magnetic, and optical properties</topic><topic>Electronic transport in condensed matter</topic><topic>Exact sciences and technology</topic><topic>Impedance</topic><topic>Laser noise</topic><topic>Measurement by laser beam</topic><topic>Photoconduction and photovoltaic effects; photodielectric effects</topic><topic>Photoconductivity</topic><topic>Physics</topic><topic>Semiconductor device measurement</topic><topic>Transient analysis</topic><topic>Transmission line measurements</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Lue, Juh Tzeng</creatorcontrib><creatorcontrib>Tzeng, Chin-Ching</creatorcontrib><collection>Pascal-Francis</collection><collection>CrossRef</collection><jtitle>IEEE transactions on instrumentation and measurement</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Lue, Juh Tzeng</au><au>Tzeng, Chin-Ching</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Transient photoconductivity measurements of amorphous semiconductors by subnanosecond nitrogen lasers</atitle><jtitle>IEEE transactions on instrumentation and measurement</jtitle><stitle>TIM</stitle><date>1986-09-01</date><risdate>1986</risdate><volume>IM-35</volume><issue>3</issue><spage>354</spage><epage>357</epage><pages>354-357</pages><issn>0018-9456</issn><eissn>1557-9662</eissn><coden>IEIMAO</coden><abstract>Picosecond N 2 lasers characterized with ultra-short pulse-width, high peak power, and simple detection installation are found very useful in diagnosing carrier behaviors of amorphous semiconductors which have low-drift mobility and a short lifetime. An impedance-matched sample holder and a fast rise-time preamplifier designed in this work provide this system with a high immunity to the background noise during the N 2 laser discharge.</abstract><cop>New York, NY</cop><pub>IEEE</pub><doi>10.1109/TIM.1986.6499224</doi><tpages>4</tpages></addata></record> |
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ispartof | IEEE transactions on instrumentation and measurement, 1986-09, Vol.IM-35 (3), p.354-357 |
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language | eng |
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source | IEEE Xplore (Online service) |
subjects | Condensed matter: electronic structure, electrical, magnetic, and optical properties Electronic transport in condensed matter Exact sciences and technology Impedance Laser noise Measurement by laser beam Photoconduction and photovoltaic effects photodielectric effects Photoconductivity Physics Semiconductor device measurement Transient analysis Transmission line measurements |
title | Transient photoconductivity measurements of amorphous semiconductors by subnanosecond nitrogen lasers |
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