Evaluation of 1/f noise variability in the subthreshold region of MOSFETs

This paper discusses the challenges of characterization of 1/f noise and its variability under weak-inversion operating conditions of MOSFETs. A dedicated test module was designed with a range of MOSFET types with different layout implementations, particularly focusing at the noise behavior of very...

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Bibliographic Details
Main Authors: Tuinhout, H., Duijnhoven, A. Z.
Format: Conference Proceeding
Language:English
Subjects:
1/f noise
Logic gates
low frequency noise measurements
Low-frequency noise
MOSFET
Noise measurement
Sociology
Statistics
subthreshold
Transistors
variability
weak inversion
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Description
Summary:This paper discusses the challenges of characterization of 1/f noise and its variability under weak-inversion operating conditions of MOSFETs. A dedicated test module was designed with a range of MOSFET types with different layout implementations, particularly focusing at the noise behavior of very wide transistors. Through extensive use of a commercial noise characterization system it proved possible to evaluate the variability of 1/f noise in weak-inversion, revealing several interesting and important subtleties of low frequency noise.
ISSN:1071-9032
2158-1029
DOI:10.1109/ICMTS.2013.6528151