Thermosensoric localization of defects in CIS solar modules

Thermal imaging by an infrared camera is proposed to localize material defects in solar cell modules. The method is demonstrated on two CuInSe/sub 2/ minimodules consisting of 5 and 9 solar cells, respectively. Compared to the optical beam induced current (OBIC) method, the new thermosensoric defect...

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Bibliographic Details
Main Authors: Gross, W., Zettner, J., Scheuerpflug, H., Hierl, Th, Schulz, M., Karg, F.
Format: Conference Proceeding
Language:English
Subjects:
Cameras
Computational Intelligence Society
COPPER SELENIDE SOLAR CELLS
CRYSTAL DEFECTS
DIAGNOSTIC TECHNIQUES
INDIUM SELENIDE SOLAR CELLS
Infrared imaging
INFRARED THERMOGRAPHY
Optical beams
Optical control
Optical device fabrication
Optical imaging
Optical materials
Photovoltaic cells
Semiconductor diodes
SOLAR ENERGY
Online Access:Request full text
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Summary:Thermal imaging by an infrared camera is proposed to localize material defects in solar cell modules. The method is demonstrated on two CuInSe/sub 2/ minimodules consisting of 5 and 9 solar cells, respectively. Compared to the optical beam induced current (OBIC) method, the new thermosensoric defect localization (TDL) method is highly sensitive in solar modules and suitable for fabrication control. Shunts in the diode junction and series resistance in the semiconductor layer or the top contact may be differentiated.
ISSN:0160-8371
DOI:10.1109/PVSC.1997.654150