Rayleigh scattering measurement of residual gas inside microwave vacuum electronic devices

We propose a method to measure the residual gas in microwave vacuum electronic devices (VED) in long-term storage based on Rayleigh scattering, and establish the relation between the gas state and the intensity of scattered light. This method can be used to monitor the status of VED in long-term sto...

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Bibliographic Details
Main Authors: Hui-yu Yuan, Chen Wu, Feng Wang, Ningfeng Bai, Hehong Fan, Pu Wei, Xinqun Zhao, Xiao-han Sun
Format: Conference Proceeding
Language:English
Subjects:
Detectors
Educational institutions
Microwave devices
Microwave measurement
Rayleigh scattering
vacuum electronic devices residual gas
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Summary:We propose a method to measure the residual gas in microwave vacuum electronic devices (VED) in long-term storage based on Rayleigh scattering, and establish the relation between the gas state and the intensity of scattered light. This method can be used to monitor the status of VED in long-term storage.
DOI:10.1109/IVEC.2013.6571099