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Switch tube test set
Diversified Technologies, Inc. (DTI), under contract for BAE Systems, developed a switch tube test set for the realistic testing and conditioning of high power modulator switch tubes employed in radar transmitters. The system may be configured for triode or tetrode tubes and has a nominal plate powe...
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creator | Kinross-Wright, John Jashari, Luan Chipman, Chris Kempkes, Michael Kurecki, Michael |
description | Diversified Technologies, Inc. (DTI), under contract for BAE Systems, developed a switch tube test set for the realistic testing and conditioning of high power modulator switch tubes employed in radar transmitters. The system may be configured for triode or tetrode tubes and has a nominal plate power rating of 30 kW. |
doi_str_mv | 10.1109/IVEC.2013.6571185 |
format | conference_proceeding |
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(DTI), under contract for BAE Systems, developed a switch tube test set for the realistic testing and conditioning of high power modulator switch tubes employed in radar transmitters. 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(DTI), under contract for BAE Systems, developed a switch tube test set for the realistic testing and conditioning of high power modulator switch tubes employed in radar transmitters. The system may be configured for triode or tetrode tubes and has a nominal plate power rating of 30 kW.</description><subject>Assembly</subject><subject>Capacitors</subject><subject>Electron tubes</subject><subject>klystron</subject><subject>modulator</subject><subject>radar</subject><subject>solidstate</subject><subject>switch tube</subject><subject>Switches</subject><subject>Switching circuits</subject><subject>Testing</subject><subject>tetrode</subject><subject>triode</subject><isbn>9781467359764</isbn><isbn>1467359769</isbn><isbn>1467359777</isbn><isbn>9781467359771</isbn><fulltext>true</fulltext><rsrctype>conference_proceeding</rsrctype><creationdate>2013</creationdate><recordtype>conference_proceeding</recordtype><sourceid>6IE</sourceid><recordid>eNo1j0FLxDAQRiMiqGtvXsRL_0DrTDKTaY5SVl1Y8LCr16VtJlhRkE1E_PcKrqePd3gPPmOuEFpECDer52XfWkDXehbEjo_MOZIXx0FEjk0VpPtnT6emyvkVAH5dgY7OzOXmay7TS10-R62L5lJnLRfmJA1vWavDLszT3XLbPzTrx_tVf7tuZhQujXACn1RcdAknicwkZMdEA4UYtXNOrGVvdYJRIAEpq8Y0JA1jRCK3MNd_3VlVdx_7-X3Yf-8OR9wPCas6XA</recordid><startdate>201305</startdate><enddate>201305</enddate><creator>Kinross-Wright, John</creator><creator>Jashari, Luan</creator><creator>Chipman, Chris</creator><creator>Kempkes, Michael</creator><creator>Kurecki, Michael</creator><general>IEEE</general><scope>6IE</scope><scope>6IL</scope><scope>CBEJK</scope><scope>RIE</scope><scope>RIL</scope></search><sort><creationdate>201305</creationdate><title>Switch tube test set</title><author>Kinross-Wright, John ; Jashari, Luan ; Chipman, Chris ; Kempkes, Michael ; Kurecki, Michael</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-i175t-75f06fe73d3f1c7d554742bf4a49dde833722562ec0b70f04e5eedfafe9bd1443</frbrgroupid><rsrctype>conference_proceedings</rsrctype><prefilter>conference_proceedings</prefilter><language>eng</language><creationdate>2013</creationdate><topic>Assembly</topic><topic>Capacitors</topic><topic>Electron tubes</topic><topic>klystron</topic><topic>modulator</topic><topic>radar</topic><topic>solidstate</topic><topic>switch tube</topic><topic>Switches</topic><topic>Switching circuits</topic><topic>Testing</topic><topic>tetrode</topic><topic>triode</topic><toplevel>online_resources</toplevel><creatorcontrib>Kinross-Wright, John</creatorcontrib><creatorcontrib>Jashari, Luan</creatorcontrib><creatorcontrib>Chipman, Chris</creatorcontrib><creatorcontrib>Kempkes, Michael</creatorcontrib><creatorcontrib>Kurecki, Michael</creatorcontrib><collection>IEEE Electronic Library (IEL) Conference Proceedings</collection><collection>IEEE Proceedings Order Plan All Online (POP All Online) 1998-present by volume</collection><collection>IEEE Xplore All Conference Proceedings</collection><collection>IEEE Xplore</collection><collection>IEEE Proceedings Order Plans (POP All) 1998-Present</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Kinross-Wright, John</au><au>Jashari, Luan</au><au>Chipman, Chris</au><au>Kempkes, Michael</au><au>Kurecki, Michael</au><format>book</format><genre>proceeding</genre><ristype>CONF</ristype><atitle>Switch tube test set</atitle><btitle>2013 IEEE 14th International Vacuum Electronics Conference (IVEC)</btitle><stitle>IVEC</stitle><date>2013-05</date><risdate>2013</risdate><spage>1</spage><epage>2</epage><pages>1-2</pages><isbn>9781467359764</isbn><isbn>1467359769</isbn><eisbn>1467359777</eisbn><eisbn>9781467359771</eisbn><abstract>Diversified Technologies, Inc. (DTI), under contract for BAE Systems, developed a switch tube test set for the realistic testing and conditioning of high power modulator switch tubes employed in radar transmitters. The system may be configured for triode or tetrode tubes and has a nominal plate power rating of 30 kW.</abstract><pub>IEEE</pub><doi>10.1109/IVEC.2013.6571185</doi><tpages>2</tpages></addata></record> |
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identifier | ISBN: 9781467359764 |
ispartof | 2013 IEEE 14th International Vacuum Electronics Conference (IVEC), 2013, p.1-2 |
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language | eng |
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source | IEEE Electronic Library (IEL) Conference Proceedings |
subjects | Assembly Capacitors Electron tubes klystron modulator radar solidstate switch tube Switches Switching circuits Testing tetrode triode |
title | Switch tube test set |
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