Radiation effects on current field programmable technologies

Manufacturers of field programmable gate arrays (FPGAs) take different technological and architectural approaches that directly affect radiation performance. Similar technological and architectural features are used in related technologies such as programmable substrates and quick-turn application s...

Full description

Saved in:
Bibliographic Details
Published in:IEEE transactions on nuclear science 1997-12, Vol.44 (6), p.1945-1956
Main Authors: Katz, R., LaBel, K., Wang, J.J., Cronquist, B., Koga, R., Penzin, S., Swift, G.
Format: Article
Language:English
Subjects:
Application specific integrated circuits
Circuit faults
Circuit testing
Degradation
Field programmable gate arrays
Integrated circuit technology
Manufacturing
Performance analysis
Radiation effects
Space technology
Citations: Items that this one cites
Items that cite this one
Online Access:Get full text
Tags: Add Tag
No Tags, Be the first to tag this record!
Description
Summary:Manufacturers of field programmable gate arrays (FPGAs) take different technological and architectural approaches that directly affect radiation performance. Similar technological and architectural features are used in related technologies such as programmable substrates and quick-turn application specific integrated circuits (ASICs). After analyzing current technologies and architectures and their radiation-effects implications, this paper includes extensive test data quantifying various devices' total dose and single event susceptibilities, including performance degradation effects and temporary or permanent re-configuration faults. Test results will concentrate on recent technologies being used in space flight electronic systems and those being developed for use in the near term. This paper will provide the first extensive study of various configuration memories used in programmable devices. Radiation performance limits and their impacts will be discussed for each design. In addition, the interplay between device scaling, process, bias voltage, design, and architecture will be explored. Lastly, areas of ongoing research will be discussed.
ISSN:0018-9499
1558-1578
DOI:10.1109/23.658966