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Layout-aware, distributed, compact model for multi-finger MOSFETs operating under ESD conditions

This work presents a scalable, distributed model for multi-finger MOSFETs operating under ESD conditions. A three-terminal transmission line pulsing measurement technique enables the model parameter extraction. The distributed model can reproduce trigger voltage, on-state resistance, and non-uniform...

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Bibliographic Details
Main Authors: Kuo-Hsuan Meng, Rosenbaum, Elyse
Format: Conference Proceeding
Language:English
Subjects:
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Summary:This work presents a scalable, distributed model for multi-finger MOSFETs operating under ESD conditions. A three-terminal transmission line pulsing measurement technique enables the model parameter extraction. The distributed model can reproduce trigger voltage, on-state resistance, and non-uniform turn-on effect as functions of layout geometries.
ISSN:0739-5159
2164-9340