Single Event Burnout Observed in Schottky Diodes

We present observations of single event burnout in 200V Schottky diodes used in hybrid DC-DC converters. Two diode types were tested and showed varying sensitivity to heavy ions and protons.

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Bibliographic Details
Main Authors: George, Jeffrey S., Koga, Rocky, Moision, Robert M., Arroyo, Arturo
Format: Conference Proceeding
Language:English
Subjects:
Ions
Protons
Schottky barriers
Schottky diodes
Silicon
Threshold voltage
Online Access:Request full text
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Description
Summary:We present observations of single event burnout in 200V Schottky diodes used in hybrid DC-DC converters. Two diode types were tested and showed varying sensitivity to heavy ions and protons.
ISSN:2154-0519
2154-0535
DOI:10.1109/REDW.2013.6658207