Total Dose and Single Event Effects Testing of the Intersil ISL70444SEH Hardened Operational Amplifier

We report the results of SEE and low and high dose rate total dose testing of the Intersil ISL70444SEH hardened operational amplifier together with a discussion of the part's electrical specifications and wafer fabrication process.

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Bibliographic Details
Main Authors: van Vonno, N. W., Williams, B., Hood, R., Thomson, E. J., Bernard, S. K.
Format: Conference Proceeding
Language:English
Subjects:
Annealing
Monitoring
Operational amplifiers
Power supplies
Radiation effects
Testing
Transient analysis
Online Access:Request full text
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Description
Summary:We report the results of SEE and low and high dose rate total dose testing of the Intersil ISL70444SEH hardened operational amplifier together with a discussion of the part's electrical specifications and wafer fabrication process.
ISSN:2154-0519
2154-0535
DOI:10.1109/REDW.2013.6658221