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Control of point defects and arsenic clusters in low-temperature grown GaAs by isovalent impurity doping
We show that isovalent indium impurity doping can be employed to control excess-arsenic-related point defects and arsenic clusters in GaAs films grown by molecular-beam epitaxy at low temperature. In respect of arsenic excess, indium doping was found to be equivalent to a decrease in the growth temp...
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creator | Chaldyshev, V.V. Bert, N.A. Faleev, N.N. Kunitsyn, A.E. Musikhin, Yu.G. Preobrazhenskii, V.V. Putyato, M.A. Semyagin, B.R. Werner, P. |
description | We show that isovalent indium impurity doping can be employed to control excess-arsenic-related point defects and arsenic clusters in GaAs films grown by molecular-beam epitaxy at low temperature. In respect of arsenic excess, indium doping was found to be equivalent to a decrease in the growth temperature, but provided better crystalline quality of the material. Indium delta-doping was used to create two-dimensional sheets of arsenic clusters in the GaAs matrix. We demonstrate a 30-period superlattice of two-dimensional cluster sheets separated by cluster-flee spacers and two cluster sheets sandwiched between n- and p-GaAs layers grown at conventional temperature. |
doi_str_mv | 10.1109/EDMO.1997.668579 |
format | conference_proceeding |
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In respect of arsenic excess, indium doping was found to be equivalent to a decrease in the growth temperature, but provided better crystalline quality of the material. Indium delta-doping was used to create two-dimensional sheets of arsenic clusters in the GaAs matrix. We demonstrate a 30-period superlattice of two-dimensional cluster sheets separated by cluster-flee spacers and two cluster sheets sandwiched between n- and p-GaAs layers grown at conventional temperature.</description><identifier>ISBN: 9780780341357</identifier><identifier>ISBN: 078034135X</identifier><identifier>DOI: 10.1109/EDMO.1997.668579</identifier><language>eng</language><publisher>IEEE</publisher><subject>Crystalline materials ; Crystallization ; Doping ; Gallium arsenide ; Impurities ; Indium ; Molecular beam epitaxial growth ; Sheet materials ; Superlattices ; Temperature control</subject><ispartof>IEEE MTT/ED/AP/LEO Societies Joint Chapter United Kingdom and Republic of Ireland Section. 1997 Workshop on High Performance Electron Devices for Microwave and Optoelectronic Applications. 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We demonstrate a 30-period superlattice of two-dimensional cluster sheets separated by cluster-flee spacers and two cluster sheets sandwiched between n- and p-GaAs layers grown at conventional temperature.</description><subject>Crystalline materials</subject><subject>Crystallization</subject><subject>Doping</subject><subject>Gallium arsenide</subject><subject>Impurities</subject><subject>Indium</subject><subject>Molecular beam epitaxial growth</subject><subject>Sheet materials</subject><subject>Superlattices</subject><subject>Temperature control</subject><isbn>9780780341357</isbn><isbn>078034135X</isbn><fulltext>true</fulltext><rsrctype>conference_proceeding</rsrctype><creationdate>1997</creationdate><recordtype>conference_proceeding</recordtype><sourceid>6IE</sourceid><recordid>eNotkMFLwzAYxQMiKHN38fT9A51JkzTNcdQ5hckueh5p-2VG2qQkmWP_vYX5eI93-8F7hDwyumKM6ufNy8d-xbRWq6qqpdI3ZKlVTWdzwbhUd2SZ0g-dJaRksr4n303wOYYBgoUpOJ-hR4tdTmB8DyYm9K6DbjiljDGB8zCEc5FxnDCafIoIxxjOHrZmnaC9gEvh1ww4c9w4naLLF-jD5PzxgdxaMyRc_veCfL1uPpu3YrffvjfrXeEYFbko61Yhk1KJXlBq2s7QOVpJ1KUVdWsV4yXVjOsahRUVZ2rexq2seMUqVvIFebpyHSIepuhGEy-H6x38D744Vg0</recordid><startdate>1997</startdate><enddate>1997</enddate><creator>Chaldyshev, V.V.</creator><creator>Bert, N.A.</creator><creator>Faleev, N.N.</creator><creator>Kunitsyn, A.E.</creator><creator>Musikhin, Yu.G.</creator><creator>Preobrazhenskii, V.V.</creator><creator>Putyato, M.A.</creator><creator>Semyagin, B.R.</creator><creator>Werner, P.</creator><general>IEEE</general><scope>6IE</scope><scope>6IL</scope><scope>CBEJK</scope><scope>RIE</scope><scope>RIL</scope></search><sort><creationdate>1997</creationdate><title>Control of point defects and arsenic clusters in low-temperature grown GaAs by isovalent impurity doping</title><author>Chaldyshev, V.V. ; Bert, N.A. ; Faleev, N.N. ; Kunitsyn, A.E. ; Musikhin, Yu.G. ; Preobrazhenskii, V.V. ; Putyato, M.A. ; Semyagin, B.R. ; Werner, P.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-i104t-28b7e15574d400abca0bca975e92f48bf7132091398e4f463170343f563616123</frbrgroupid><rsrctype>conference_proceedings</rsrctype><prefilter>conference_proceedings</prefilter><language>eng</language><creationdate>1997</creationdate><topic>Crystalline materials</topic><topic>Crystallization</topic><topic>Doping</topic><topic>Gallium arsenide</topic><topic>Impurities</topic><topic>Indium</topic><topic>Molecular beam epitaxial growth</topic><topic>Sheet materials</topic><topic>Superlattices</topic><topic>Temperature control</topic><toplevel>online_resources</toplevel><creatorcontrib>Chaldyshev, V.V.</creatorcontrib><creatorcontrib>Bert, N.A.</creatorcontrib><creatorcontrib>Faleev, N.N.</creatorcontrib><creatorcontrib>Kunitsyn, A.E.</creatorcontrib><creatorcontrib>Musikhin, Yu.G.</creatorcontrib><creatorcontrib>Preobrazhenskii, V.V.</creatorcontrib><creatorcontrib>Putyato, M.A.</creatorcontrib><creatorcontrib>Semyagin, B.R.</creatorcontrib><creatorcontrib>Werner, P.</creatorcontrib><collection>IEEE Electronic Library (IEL) Conference Proceedings</collection><collection>IEEE Proceedings Order Plan All Online (POP All Online) 1998-present by volume</collection><collection>IEEE Xplore All Conference Proceedings</collection><collection>IEEE Electronic Library (IEL)</collection><collection>IEEE Proceedings Order Plans (POP All) 1998-Present</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Chaldyshev, V.V.</au><au>Bert, N.A.</au><au>Faleev, N.N.</au><au>Kunitsyn, A.E.</au><au>Musikhin, Yu.G.</au><au>Preobrazhenskii, V.V.</au><au>Putyato, M.A.</au><au>Semyagin, B.R.</au><au>Werner, P.</au><format>book</format><genre>proceeding</genre><ristype>CONF</ristype><atitle>Control of point defects and arsenic clusters in low-temperature grown GaAs by isovalent impurity doping</atitle><btitle>IEEE MTT/ED/AP/LEO Societies Joint Chapter United Kingdom and Republic of Ireland Section. 1997 Workshop on High Performance Electron Devices for Microwave and Optoelectronic Applications. EDMO (Cat</btitle><stitle>EDMO</stitle><date>1997</date><risdate>1997</risdate><spage>91</spage><epage>96</epage><pages>91-96</pages><isbn>9780780341357</isbn><isbn>078034135X</isbn><abstract>We show that isovalent indium impurity doping can be employed to control excess-arsenic-related point defects and arsenic clusters in GaAs films grown by molecular-beam epitaxy at low temperature. In respect of arsenic excess, indium doping was found to be equivalent to a decrease in the growth temperature, but provided better crystalline quality of the material. Indium delta-doping was used to create two-dimensional sheets of arsenic clusters in the GaAs matrix. We demonstrate a 30-period superlattice of two-dimensional cluster sheets separated by cluster-flee spacers and two cluster sheets sandwiched between n- and p-GaAs layers grown at conventional temperature.</abstract><pub>IEEE</pub><doi>10.1109/EDMO.1997.668579</doi><tpages>6</tpages></addata></record> |
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source | IEEE Electronic Library (IEL) Conference Proceedings |
subjects | Crystalline materials Crystallization Doping Gallium arsenide Impurities Indium Molecular beam epitaxial growth Sheet materials Superlattices Temperature control |
title | Control of point defects and arsenic clusters in low-temperature grown GaAs by isovalent impurity doping |
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