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A fully scalable compact small-signal modeling approach for 100 nm AlGaN/GaN HEMTs
In this paper, we present a fully-scalable compact small-signal equivalent circuit model for AlGaN/GaN HEMTs with a gate length of 100 nm. The compact model yields a parasitic shell topology and is scalable from two up to eight transistor-fingers and is valid for finger lengths from 15 μm to 100 μm....
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creator | Schwantuschke, D. Seelmann-Eggebert, M. Bruckner, P. Quay, R. Mikulla, M. Ambacher, O. Kallfass, I. |
description | In this paper, we present a fully-scalable compact small-signal equivalent circuit model for AlGaN/GaN HEMTs with a gate length of 100 nm. The compact model yields a parasitic shell topology and is scalable from two up to eight transistor-fingers and is valid for finger lengths from 15 μm to 100 μm. It accurately covers the frequency range from 100 MHz up to at least 110 GHz and a wide range of bias utilized for typical class-AB operation points of this technology. Both, direct parameter extractions as well as optimization-based techniques were applied for the determination of the model parameters. |
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Both, direct parameter extractions as well as optimization-based techniques were applied for the determination of the model parameters.</description><identifier>EISBN: 9782874870323</identifier><identifier>EISBN: 2874870323</identifier><language>eng</language><publisher>European Microwave Association</publisher><subject>100 nm GaN ; AlGaN/GaN-HEMT technology ; Capacitance ; compact small-signal model ; equivilent circuit model ; Fingers ; HEMTs ; Integrated circuit modeling ; Logic gates ; millimeter-wave ; MODFETs ; Scalable model</subject><ispartof>2013 European Microwave Integrated Circuit Conference, 2013, p.284-287</ispartof><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://ieeexplore.ieee.org/document/6687841$$EHTML$$P50$$Gieee$$H</linktohtml><link.rule.ids>309,310,780,784,789,790,2058,54920</link.rule.ids><linktorsrc>$$Uhttps://ieeexplore.ieee.org/document/6687841$$EView_record_in_IEEE$$FView_record_in_$$GIEEE</linktorsrc></links><search><creatorcontrib>Schwantuschke, D.</creatorcontrib><creatorcontrib>Seelmann-Eggebert, M.</creatorcontrib><creatorcontrib>Bruckner, P.</creatorcontrib><creatorcontrib>Quay, R.</creatorcontrib><creatorcontrib>Mikulla, M.</creatorcontrib><creatorcontrib>Ambacher, O.</creatorcontrib><creatorcontrib>Kallfass, I.</creatorcontrib><title>A fully scalable compact small-signal modeling approach for 100 nm AlGaN/GaN HEMTs</title><title>2013 European Microwave Integrated Circuit Conference</title><addtitle>EuMIC</addtitle><description>In this paper, we present a fully-scalable compact small-signal equivalent circuit model for AlGaN/GaN HEMTs with a gate length of 100 nm. 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Both, direct parameter extractions as well as optimization-based techniques were applied for the determination of the model parameters.</description><subject>100 nm GaN</subject><subject>AlGaN/GaN-HEMT technology</subject><subject>Capacitance</subject><subject>compact small-signal model</subject><subject>equivilent circuit model</subject><subject>Fingers</subject><subject>HEMTs</subject><subject>Integrated circuit modeling</subject><subject>Logic gates</subject><subject>millimeter-wave</subject><subject>MODFETs</subject><subject>Scalable model</subject><isbn>9782874870323</isbn><isbn>2874870323</isbn><fulltext>true</fulltext><rsrctype>conference_proceeding</rsrctype><creationdate>2013</creationdate><recordtype>conference_proceeding</recordtype><sourceid>6IE</sourceid><recordid>eNotzM1KAzEUQOG4ECp1nsBNXmAwN5nMTZZDqa1QK0hdlzvpTTuS-WFSF317BV0cvt25E4VHpx1WDpXRZiGKnL-UUoAI6PFBfDQyfqd0kzlQojaxDGM_UbjK3FNKZe7OAyXZjydO3XCWNE3zSOEi4zhLUEoOvWzShvbPv8nt-u2QH8V9pJS5-HcpPl_Wh9W23L1vXlfNruwA7bV0CA41RO8DElCkKmjSNlilDdfK2njyzNGCaW1oPUMVPVvjdBWRIbJZiqe_b8fMx2nueppvx7p26CowP_s2R6o</recordid><startdate>201310</startdate><enddate>201310</enddate><creator>Schwantuschke, D.</creator><creator>Seelmann-Eggebert, M.</creator><creator>Bruckner, P.</creator><creator>Quay, R.</creator><creator>Mikulla, M.</creator><creator>Ambacher, O.</creator><creator>Kallfass, I.</creator><general>European Microwave Association</general><scope>6IE</scope><scope>6IL</scope><scope>CBEJK</scope><scope>RIE</scope><scope>RIL</scope></search><sort><creationdate>201310</creationdate><title>A fully scalable compact small-signal modeling approach for 100 nm AlGaN/GaN HEMTs</title><author>Schwantuschke, D. ; Seelmann-Eggebert, M. ; Bruckner, P. ; Quay, R. ; Mikulla, M. ; Ambacher, O. ; Kallfass, I.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-i175t-8718721f99c7a1afa4c2a25c5023e6055fd9eef513b5cb9e14f9e53824f7e1fe3</frbrgroupid><rsrctype>conference_proceedings</rsrctype><prefilter>conference_proceedings</prefilter><language>eng</language><creationdate>2013</creationdate><topic>100 nm GaN</topic><topic>AlGaN/GaN-HEMT technology</topic><topic>Capacitance</topic><topic>compact small-signal model</topic><topic>equivilent circuit model</topic><topic>Fingers</topic><topic>HEMTs</topic><topic>Integrated circuit modeling</topic><topic>Logic gates</topic><topic>millimeter-wave</topic><topic>MODFETs</topic><topic>Scalable model</topic><toplevel>online_resources</toplevel><creatorcontrib>Schwantuschke, D.</creatorcontrib><creatorcontrib>Seelmann-Eggebert, M.</creatorcontrib><creatorcontrib>Bruckner, P.</creatorcontrib><creatorcontrib>Quay, R.</creatorcontrib><creatorcontrib>Mikulla, M.</creatorcontrib><creatorcontrib>Ambacher, O.</creatorcontrib><creatorcontrib>Kallfass, I.</creatorcontrib><collection>IEEE Electronic Library (IEL) Conference Proceedings</collection><collection>IEEE Proceedings Order Plan All Online (POP All Online) 1998-present by volume</collection><collection>IEEE Xplore All Conference Proceedings</collection><collection>IEEE Electronic Library (IEL)</collection><collection>IEEE Proceedings Order Plans (POP All) 1998-Present</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Schwantuschke, D.</au><au>Seelmann-Eggebert, M.</au><au>Bruckner, P.</au><au>Quay, R.</au><au>Mikulla, M.</au><au>Ambacher, O.</au><au>Kallfass, I.</au><format>book</format><genre>proceeding</genre><ristype>CONF</ristype><atitle>A fully scalable compact small-signal modeling approach for 100 nm AlGaN/GaN HEMTs</atitle><btitle>2013 European Microwave Integrated Circuit Conference</btitle><stitle>EuMIC</stitle><date>2013-10</date><risdate>2013</risdate><spage>284</spage><epage>287</epage><pages>284-287</pages><eisbn>9782874870323</eisbn><eisbn>2874870323</eisbn><abstract>In this paper, we present a fully-scalable compact small-signal equivalent circuit model for AlGaN/GaN HEMTs with a gate length of 100 nm. The compact model yields a parasitic shell topology and is scalable from two up to eight transistor-fingers and is valid for finger lengths from 15 μm to 100 μm. It accurately covers the frequency range from 100 MHz up to at least 110 GHz and a wide range of bias utilized for typical class-AB operation points of this technology. Both, direct parameter extractions as well as optimization-based techniques were applied for the determination of the model parameters.</abstract><pub>European Microwave Association</pub><tpages>4</tpages></addata></record> |
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language | eng |
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subjects | 100 nm GaN AlGaN/GaN-HEMT technology Capacitance compact small-signal model equivilent circuit model Fingers HEMTs Integrated circuit modeling Logic gates millimeter-wave MODFETs Scalable model |
title | A fully scalable compact small-signal modeling approach for 100 nm AlGaN/GaN HEMTs |
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