Resonant coupling for contactless measurement of carrier lifetime

We will describe the operation of the resonance-coupled photoconductive decay (RCPCD) technique. Measurements uses a high quality factor (Q) parallel resonant circuit that is in proximity to the sample under test, the system behaves like a parallel resonant RLC high-Q circuit. The system Q is adjust...

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Bibliographic Details
Main Authors: Ahrenkiel, Richard K., Johnston, Steven W.
Format: Conference Proceeding
Language:English
Subjects:
Impedance
Measurement by laser beam
RLC circuits
Semiconductor device measurement
Silicon
Surface waves
Wavelength measurement
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Summary:We will describe the operation of the resonance-coupled photoconductive decay (RCPCD) technique. Measurements uses a high quality factor (Q) parallel resonant circuit that is in proximity to the sample under test, the system behaves like a parallel resonant RLC high-Q circuit. The system Q is adjusted by q moveable platform that changes the sample-sensor spacing. The system resonant frequency w 0 is modulated b the sample conductivity. The sensitivity increases with system Q, but the response time also increases as 2LQ/sqrt(LC). Here we will present the theory of operation and representative data from a wide range of samples.
ISSN:0160-8371
DOI:10.1109/PVSC.2013.6744403