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A flexible BIST strategy for SDR transmitters
Software-defined radio (SDR) development aims for increased speed and flexibility. The advent of these systemlevel requirements on the physical layer (PHY) access hardware is leading to more complex architectures, which together with higher levels of integration pose a challenging problem for produc...
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creator | Dogaru, Emanuel Vinci dos Santos, Filipe Rebernak, William |
description | Software-defined radio (SDR) development aims for increased speed and flexibility. The advent of these systemlevel requirements on the physical layer (PHY) access hardware is leading to more complex architectures, which together with higher levels of integration pose a challenging problem for product testing. For radio units that must be field-upgradeable without specialized equipment, Built-in Self-Test (BIST) schemes are arguably the only way to ensure continued compliance to specifications. In this paper we introduce a loopback RF BIST technique that uses Periodically Nonuniform Sampling (PNS2) of the transmitter (TX) output to evaluate compliance to spectral mask specifications. No significant hardware costs are incurred due to the re-use of available RX resources (I/Q ADCs, DSP, GPP, etc.). Simulation results of an homodyne TX demonstrate that Adjacent Channel Power Ratio (ACPR) can be accurately estimated. Future work will consist in validating our loopback RF BIST architecture on an in-house SDR testbed. |
doi_str_mv | 10.7873/DATE.2014.383 |
format | conference_proceeding |
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The advent of these systemlevel requirements on the physical layer (PHY) access hardware is leading to more complex architectures, which together with higher levels of integration pose a challenging problem for product testing. For radio units that must be field-upgradeable without specialized equipment, Built-in Self-Test (BIST) schemes are arguably the only way to ensure continued compliance to specifications. In this paper we introduce a loopback RF BIST technique that uses Periodically Nonuniform Sampling (PNS2) of the transmitter (TX) output to evaluate compliance to spectral mask specifications. No significant hardware costs are incurred due to the re-use of available RX resources (I/Q ADCs, DSP, GPP, etc.). Simulation results of an homodyne TX demonstrate that Adjacent Channel Power Ratio (ACPR) can be accurately estimated. 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The advent of these systemlevel requirements on the physical layer (PHY) access hardware is leading to more complex architectures, which together with higher levels of integration pose a challenging problem for product testing. For radio units that must be field-upgradeable without specialized equipment, Built-in Self-Test (BIST) schemes are arguably the only way to ensure continued compliance to specifications. In this paper we introduce a loopback RF BIST technique that uses Periodically Nonuniform Sampling (PNS2) of the transmitter (TX) output to evaluate compliance to spectral mask specifications. No significant hardware costs are incurred due to the re-use of available RX resources (I/Q ADCs, DSP, GPP, etc.). Simulation results of an homodyne TX demonstrate that Adjacent Channel Power Ratio (ACPR) can be accurately estimated. 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The advent of these systemlevel requirements on the physical layer (PHY) access hardware is leading to more complex architectures, which together with higher levels of integration pose a challenging problem for product testing. For radio units that must be field-upgradeable without specialized equipment, Built-in Self-Test (BIST) schemes are arguably the only way to ensure continued compliance to specifications. In this paper we introduce a loopback RF BIST technique that uses Periodically Nonuniform Sampling (PNS2) of the transmitter (TX) output to evaluate compliance to spectral mask specifications. No significant hardware costs are incurred due to the re-use of available RX resources (I/Q ADCs, DSP, GPP, etc.). Simulation results of an homodyne TX demonstrate that Adjacent Channel Power Ratio (ACPR) can be accurately estimated. 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ispartof | 2014 Design, Automation & Test in Europe Conference & Exhibition (DATE), 2014, p.1-6 |
issn | 1530-1591 1558-1101 |
language | eng |
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source | IEEE Xplore All Conference Series |
subjects | BIST Built-in self-test Computer architecture Estimation Finite impulse response filters In-Field Test Mixed-Signal/RF Test Periodically Nonuniform Sampling Radio frequency Software Radios Spectral Mask Estimation Subsampling |
title | A flexible BIST strategy for SDR transmitters |
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