92% start-up time reduction by variation-tolerant chirp injection (CI) and negative resistance booster (NRB) in 39MHz crystal oscillator

To reduce the start-up time of a crystal oscillator (XO), a chirp injection (CI) and a negative resistance booster (NRB) are proposed. By combining CI and NRB, the measured start-up time of a 39-MHz XO in 180-nm CMOS is reduced by 92% from 2.1ms to 158μs, which is the shortest time in the published...

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Bibliographic Details
Main Authors: Iguchi, Shunta, Fuketa, Hiroshi, Sakurai, Takayasu, Takamiya, Makoto
Format: Conference Proceeding
Language:English
Subjects:
Chirp
Crystals
Logic gates
Radio frequency
Resistance
Temperature measurement
Time measurement
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Summary:To reduce the start-up time of a crystal oscillator (XO), a chirp injection (CI) and a negative resistance booster (NRB) are proposed. By combining CI and NRB, the measured start-up time of a 39-MHz XO in 180-nm CMOS is reduced by 92% from 2.1ms to 158μs, which is the shortest time in the published XO's. The measured start-up time variations due to the ±20% supply voltage change or the temperature change are less than 13%.
ISSN:2158-5601
2158-5636
DOI:10.1109/VLSIC.2014.6858449