A new efficient method for characterizing time constants of switching oxide traps

In this paper, a new method named Incremental Trap-Response (ITR) is proposed for characterizing the time constants of switching oxide traps, which can be used to expand the voltage detectable window of RTN. Both theoretical and experimental results demonstrate that the new ITR method has higher acc...

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Bibliographic Details
Main Authors: Shaofeng Guo, Pengpeng Ren, Runsheng Wang, Zhuoqing Yu, Mulong Luo, Xing Zhang, Ru Huang
Format: Conference Proceeding
Language:English
Subjects:
Accuracy
characterizing method
Electron traps
Fitting
Integrated circuit reliability
Logic gates
MC simulation
MOSFETs
Switches
switching oxide traps
time constants
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Summary:In this paper, a new method named Incremental Trap-Response (ITR) is proposed for characterizing the time constants of switching oxide traps, which can be used to expand the voltage detectable window of RTN. Both theoretical and experimental results demonstrate that the new ITR method has higher accuracy and is more time-efficient than recently proposed Statistical Trap-Response (STR) method, thus is helpful for trap-related research on both reliability and variability.
ISSN:1541-7026
1938-1891
DOI:10.1109/IRPS.2014.6861191