A reliable 40 GHz opto-electrical system for characterization of frequency response of Ge PIN photo detectors

This study presents calibration of a self-built 40 GHz measurement setup using vector network analyzer and Mach-Zehnder modulator. The setup is used for frequency response characterization of Ge PIN photodetectors.

Saved in:
Bibliographic Details
Main Authors: Wogong Zhang, Kaiheng Ye, Bechler, Stefan, Ulbricht, Kai, Oehme, Micheal, Kasper, Erich, Schulze, Jorg
Format: Conference Proceeding
Language:English
Subjects:
Erbium
Frequency response
Modulation
Reliability engineering
Semiconductor device measurement
Wavelength measurement
Online Access:Request full text
Tags: Add Tag
No Tags, Be the first to tag this record!
Description
Summary:This study presents calibration of a self-built 40 GHz measurement setup using vector network analyzer and Mach-Zehnder modulator. The setup is used for frequency response characterization of Ge PIN photodetectors.
DOI:10.1109/ISTDM.2014.6874649