Single-Flange 2-Port TRL Calibration for Accurate THz -Parameter Measurements of Waveguide Integrated Circuits

This paper describes a single flange 2-port measurement setup for S-parameter characterization of waveguide integrated devices. The setup greatly reduces calibration and measurement uncertainty by eliminating vector network analyzer (VNA) extender cable movement and minimizing the effect of waveguid...

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Bibliographic Details
Published in:IEEE transactions on terahertz science and technology 2014-09, Vol.4 (5), p.582-587
Main Authors: Hanning, Johanna, Stenarson, Jorgen, Yhland, Klas, Sobis, Peter J., Bryllert, Tomas, Stake, Jan
Format: Article
Language:English
Subjects:
Calibration
Educational institutions
Membrane
Microwave circuits
TRL
Uncertainty
waveguide integrated
{\rm S} -parameter
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Summary:This paper describes a single flange 2-port measurement setup for S-parameter characterization of waveguide integrated devices. The setup greatly reduces calibration and measurement uncertainty by eliminating vector network analyzer (VNA) extender cable movement and minimizing the effect of waveguide manufacturing tolerances. Change time of standards is also improved, reducing the influence of VNA drift on the uncertainty. A TRL calibration kit has been manufactured and measurements are demonstrated in WR-03 (220-325 GHz).
ISSN:2156-342X
2156-3446
DOI:10.1109/TTHZ.2014.2342497