SEE test results of the LVDS Driver and Receiver

We report on results of SEE (SEL, SET) tests of LVDS Quad Drivers and Receivers from different manufactures. In particular, this report provides a good way to characterize SET from user point of view, calculated the error rate as SEU, and analyzes the SET result and determines if data are lost durin...

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Bibliographic Details
Main Authors: Wang, Pierre-Xiao, Gil, Mathieu, Widmer, Fabien, Garcia, Pierre
Format: Conference Proceeding
Language:English
Subjects:
Cross Section
Error analysis
Error Rate
Lost Frame
Low-Voltage Differential Signaling (LVDS)
Oscilloscopes
Power supplies
Radiation detectors
Receivers
Sensitivity
Single Event Effect (SEE)
Single Event Latch-up(SEL)
Single Event Transient (SET)
Single Event Upset(SEU)
Wires
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Description
Summary:We report on results of SEE (SEL, SET) tests of LVDS Quad Drivers and Receivers from different manufactures. In particular, this report provides a good way to characterize SET from user point of view, calculated the error rate as SEU, and analyzes the SET result and determines if data are lost during an SET event.
DOI:10.1109/RADECS.2013.6937394