Mitigation of single-event charge sharing in a commercial FPGA architecture

The motivation for single event effects (SEE) analysis and mitigation as part of the process for adaptation of a commercial Field Programmable Gate Array (FPGA) architecture for space-qualified applications is discussed. The interdependent roles of heavy-ion and laser-induced upset evaluation couple...

Full description

Saved in:
Bibliographic Details
Main Authors: Kelly, Andrew T., Alles, Michael L., Ball, Dennis R., Massengill, Lloyd W., Ramaswamy, S., Haddad, Nadim F., Brown, Ronald D., Fleming, Patrick R., Chan, Ernesto, Ekanayake, Virantha, Kelly, Clinton W., Pelosi, Christopher, McMorrow, Dale, Buchner, Steven P., Warner, Jeffery H., Berg, Melanie D.
Format: Conference Proceeding
Language:English
Subjects:
Arrays
charge sharing
Field programmable gate arrays
Performance evaluation
Radiation detectors
radiation hardening by design
RHFGPA
Shift registers
Single event effects
System recovery
Testing
Online Access:Request full text
Tags: Add Tag
No Tags, Be the first to tag this record!
Description
Summary:The motivation for single event effects (SEE) analysis and mitigation as part of the process for adaptation of a commercial Field Programmable Gate Array (FPGA) architecture for space-qualified applications is discussed. The interdependent roles of heavy-ion and laser-induced upset evaluation coupled with computer-aided investigations of SEE mechanisms and mitigation techniques in this process are shown to enable a significant reduction in SEE sensitivity of the device, while achieving minimal impact on remanufacturing steps.
DOI:10.1109/RADECS.2013.6937410