Wavelength influence on CMOS SOS IC dose rate laser simulation efficiency

Dose rate effects wavelength dependence under pulsed laser irradiation of typical CMOS thin-film structure is investigated. The optimal wavelength for maximum laser simulation efficiency is defined.

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Bibliographic Details
Main Authors: Skorobogatov, Petr K., Nikiforov, Alexander Y., Egorov, Andrey N., Ulanova, Anastasiya V., Davydov, Georgiy G.
Format: Conference Proceeding
Language:English
Subjects:
Absorption
CMOS integrated circuits
dose rate effects
Inverters
laser wavelength
Lasers
Logic gates
Radiation effects
Semiconductor device modeling
SOS structure
Online Access:Request full text
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Description
Summary:Dose rate effects wavelength dependence under pulsed laser irradiation of typical CMOS thin-film structure is investigated. The optimal wavelength for maximum laser simulation efficiency is defined.
DOI:10.1109/RADECS.2013.6937412