Reliability improving of test monitoring of complex digital electronic devices

In design and development of a monitoring system for digital electronic devices one of the main problems is the synthesis of test pseudorandom sequences (PS) with required features. The analytical estimators of correcting capacity of test PS based on their statistical features are derived in the pap...

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Bibliographic Details
Main Authors: Svetlov, M. S., L'vov, A. A., Ulyanina, Yu A.
Format: Conference Proceeding
Language:English
Subjects:
Discharges (electric)
Insulation
Interrupters
Monitoring
Presses
Reliability
Switching circuits
Online Access:Request full text
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Summary:In design and development of a monitoring system for digital electronic devices one of the main problems is the synthesis of test pseudorandom sequences (PS) with required features. The analytical estimators of correcting capacity of test PS based on their statistical features are derived in the paper. The results obtained allow one to rise drastically the efficiency and reliability of diagnostic procedures of complex digital devices.
DOI:10.1109/APEDE.2014.6958271