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Absolute Intensity Measurements of CW GHz and THz Radiation Using Electro-Optic Sampling
We report on traceable and spatially resolved intensity measurements of continuous wave (CW) radiation at 100 GHz using laser-based electro-optic (EO) sampling. Traceability of the laser-based setup is achieved by comparison of the EO measurements with measurements using a calibrated radiometer. The...
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Published in: | IEEE transactions on instrumentation and measurement 2015-06, Vol.64 (6), p.1734-1740 |
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container_title | IEEE transactions on instrumentation and measurement |
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creator | Yuqiang Deng Fuser, Heiko Bieler, Mark |
description | We report on traceable and spatially resolved intensity measurements of continuous wave (CW) radiation at 100 GHz using laser-based electro-optic (EO) sampling. Traceability of the laser-based setup is achieved by comparison of the EO measurements with measurements using a calibrated radiometer. The uncertainty budget of the EO measurements is discussed in detail. Although we just perform intensity measurements at ~100 GHz, the EO setup can be used for characterization of CW sources over a very broad frequency range from a few gigahertz to ~2.5 THz. |
doi_str_mv | 10.1109/TIM.2014.2375692 |
format | article |
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Traceability of the laser-based setup is achieved by comparison of the EO measurements with measurements using a calibrated radiometer. The uncertainty budget of the EO measurements is discussed in detail. Although we just perform intensity measurements at ~100 GHz, the EO setup can be used for characterization of CW sources over a very broad frequency range from a few gigahertz to ~2.5 THz.</description><subject>Absolute intensity measurements</subject><subject>Antenna measurements</subject><subject>Crystals</subject><subject>electro-optic (EO) sampling</subject><subject>Frequency measurement</subject><subject>Measurement by laser beam</subject><subject>Measurement uncertainty</subject><subject>Radiometry</subject><subject>terahertz (THz) metrology</subject><subject>Uncertainty</subject><issn>0018-9456</issn><issn>1557-9662</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2015</creationdate><recordtype>article</recordtype><recordid>eNo9kEtLAzEYRYMoWKt7wU3-wNS8M1mWUttCS0FbdDd8mSQyMo8ySRf11zulxdWFyz13cRB6pmRCKTGvu9VmwggVE8a1VIbdoBGVUmdGKXaLRoTQPDNCqnv0EOMPIUQroUfoa2pjVx-Tx6s2-TZW6YQ3HuKx941vU8RdwLNPvFj-Ymgd3g35Dq6CVHUt3seq_cbz2pep77LtIVUl_oDmUA_1I7oLUEf_dM0x2r_Nd7Nltt4uVrPpOisF4SnTVAeQXAEQ4ZgjzjhndKBKCctcSZiW1orc2tw4A14YkGABnOchOGoCHyNy-S37Lsbeh-LQVw30p4KS4mymGMwUZzPF1cyAvFyQynv_P1cm54oz_ge_zWCx</recordid><startdate>20150601</startdate><enddate>20150601</enddate><creator>Yuqiang Deng</creator><creator>Fuser, Heiko</creator><creator>Bieler, Mark</creator><general>IEEE</general><scope>97E</scope><scope>RIA</scope><scope>RIE</scope><scope>AAYXX</scope><scope>CITATION</scope></search><sort><creationdate>20150601</creationdate><title>Absolute Intensity Measurements of CW GHz and THz Radiation Using Electro-Optic Sampling</title><author>Yuqiang Deng ; Fuser, Heiko ; Bieler, Mark</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c403t-717fa536aa04d2d0d9dd97f1664b2dc0275bb48bb89d9ae49a5abaade3ffd19f3</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2015</creationdate><topic>Absolute intensity measurements</topic><topic>Antenna measurements</topic><topic>Crystals</topic><topic>electro-optic (EO) sampling</topic><topic>Frequency measurement</topic><topic>Measurement by laser beam</topic><topic>Measurement uncertainty</topic><topic>Radiometry</topic><topic>terahertz (THz) metrology</topic><topic>Uncertainty</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Yuqiang Deng</creatorcontrib><creatorcontrib>Fuser, Heiko</creatorcontrib><creatorcontrib>Bieler, Mark</creatorcontrib><collection>IEEE All-Society Periodicals Package (ASPP) 2005-present</collection><collection>IEEE All-Society Periodicals Package (ASPP) 1998-Present</collection><collection>IEL</collection><collection>CrossRef</collection><jtitle>IEEE transactions on instrumentation and measurement</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Yuqiang Deng</au><au>Fuser, Heiko</au><au>Bieler, Mark</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Absolute Intensity Measurements of CW GHz and THz Radiation Using Electro-Optic Sampling</atitle><jtitle>IEEE transactions on instrumentation and measurement</jtitle><stitle>TIM</stitle><date>2015-06-01</date><risdate>2015</risdate><volume>64</volume><issue>6</issue><spage>1734</spage><epage>1740</epage><pages>1734-1740</pages><issn>0018-9456</issn><eissn>1557-9662</eissn><coden>IEIMAO</coden><abstract>We report on traceable and spatially resolved intensity measurements of continuous wave (CW) radiation at 100 GHz using laser-based electro-optic (EO) sampling. Traceability of the laser-based setup is achieved by comparison of the EO measurements with measurements using a calibrated radiometer. The uncertainty budget of the EO measurements is discussed in detail. Although we just perform intensity measurements at ~100 GHz, the EO setup can be used for characterization of CW sources over a very broad frequency range from a few gigahertz to ~2.5 THz.</abstract><pub>IEEE</pub><doi>10.1109/TIM.2014.2375692</doi><tpages>7</tpages></addata></record> |
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subjects | Absolute intensity measurements Antenna measurements Crystals electro-optic (EO) sampling Frequency measurement Measurement by laser beam Measurement uncertainty Radiometry terahertz (THz) metrology Uncertainty |
title | Absolute Intensity Measurements of CW GHz and THz Radiation Using Electro-Optic Sampling |
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