Atomic interferences and the measurement process

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Main Author: Pfau, T.
Format: Conference Proceeding
Language:English
Subjects:
Atomic measurements
Interference
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doi_str_mv 10.1109/EQEC.1994.698515
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identifier ISBN: 9780780317918
ispartof Proceedings of 5th European Quantum Electronics Conference, 1994, p.282-283
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language eng
recordid cdi_ieee_primary_698515
source IEEE Electronic Library (IEL) Conference Proceedings
subjects Atomic measurements
Interference
title Atomic interferences and the measurement process
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