SEE Test Results of Electronic Components Performed on Roscosmos Test Facilities

The paper presents SEE test results of electronic components foreseen to be used in the satellite equipment. They were provided to determine electronic components hardness level and also SETs studying and techniques to record them.

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Bibliographic Details
Main Authors: Anashin, Vasily S., Koziukov, Aleksandr E., Kazyakin, Anatoly A., Kuznetsov, Alexander S., Bakirov, Linaris R., Korolev, Viacheslav S., Artemyev, Kirill A., Faradian, Konstantin Zh
Format: Conference Proceeding
Language:English
Subjects:
CMOS integrated circuits
Cyclotrons
Electronic components
Inspection
Radiation effects
Test facilities
Online Access:Request full text
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Description
Summary:The paper presents SEE test results of electronic components foreseen to be used in the satellite equipment. They were provided to determine electronic components hardness level and also SETs studying and techniques to record them.
ISSN:2154-0519
2154-0535
DOI:10.1109/REDW.2014.7004588