Test pattern generation in presence of unknown values based on restricted symbolic logic

Test generation algorithms based on standard n-valued logic algebras are pessimistic in presence of unknown (X) values, overestimate the number of signals with X-values and underestimate fault coverage.

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Bibliographic Details
Main Authors: Erb, Dominik, Scheibler, Karsten, Kochte, Michael A., Sauer, Matthias, Wunderlich, Hans-Joachim, Becker, Bernd
Format: Conference Proceeding
Language:English
Subjects:
Algebra
ATPG
Automatic test pattern generation
Circuit faults
Encoding
Integrated circuit modeling
Logic gates
QBF
Restricted symbolic logic
Runtime
SAT
test generation
Unknown values
Online Access:Request full text
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Description
Summary:Test generation algorithms based on standard n-valued logic algebras are pessimistic in presence of unknown (X) values, overestimate the number of signals with X-values and underestimate fault coverage.
ISSN:1089-3539
2378-2250
DOI:10.1109/TEST.2014.7035350