Pulsed NVNA measurements for dynamic characterization of RF PAs

Due to the ever increasing design complexity and bandwidth requirements, it has become increasingly more challenging to achieve an accurate large-signal characterization of modern Radio Frequency (RF) Power Amplifiers (PAs). This paper deals with such challenges presenting a handset PA characterizat...

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Bibliographic Details
Main Authors: Gibiino, Gian Piero, Tafuri, Felice Francesco, Nielsen, Troels S., Schreurs, Dominique, Santarelli, Alberto
Format: Conference Proceeding
Language:English
Subjects:
behavioral modeling
Delays
Harmonic analysis
Microwave measurement
Nonlinear Vector Network Analyzer
Power measurement
Pulse measurements
pulsed measurements
Radio frequency
Semiconductor device measurement
X-parameters
Online Access:Request full text
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Summary:Due to the ever increasing design complexity and bandwidth requirements, it has become increasingly more challenging to achieve an accurate large-signal characterization of modern Radio Frequency (RF) Power Amplifiers (PAs). This paper deals with such challenges presenting a handset PA characterization method using pulsed Continuous Wave (CW) RF excitation signals. It is shown how such measurements and quasi-static X-parameters, can be used to identify long term memory effects present in a commercially available power amplifier.
ISSN:2377-9144
2377-9152
DOI:10.1109/IMaRC.2014.7038978