Loading…

Adjustable voltage dependent switching characteristics of PRAM for low voltage programming of multi-level resistances

Low voltage programming of multi-level-cell phase change random access memory (MLC PRAM) is important for future low power high density applications of PRAM devices [1]. We have characterized voltage dependent resistance switching characteristics of PRAM devices with various voltage pulses, based on...

Full description

Saved in:
Bibliographic Details
Main Authors: Gwihyun Kim, Sanghyun Lee, Seungwoo Hong, Seung Jae Baik, Hori, Hideki, Dong-ho Ahn
Format: Conference Proceeding
Language:English
Subjects:
Online Access:Request full text
Tags: Add Tag
No Tags, Be the first to tag this record!
cited_by
cites
container_end_page 3
container_issue
container_start_page 1
container_title
container_volume
creator Gwihyun Kim
Sanghyun Lee
Seungwoo Hong
Seung Jae Baik
Hori, Hideki
Dong-ho Ahn
description Low voltage programming of multi-level-cell phase change random access memory (MLC PRAM) is important for future low power high density applications of PRAM devices [1]. We have characterized voltage dependent resistance switching characteristics of PRAM devices with various voltage pulses, based on which a dual-pulse programming method is systematically proposed to demonstrate some principles of low voltage MLC programming. A microstructural model is also introduced to provide a comprehensive explanation of resistance swiching for various voltage pulses.
doi_str_mv 10.1109/NVMTS.2014.7060862
format conference_proceeding
fullrecord <record><control><sourceid>ieee_6IE</sourceid><recordid>TN_cdi_ieee_primary_7060862</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><ieee_id>7060862</ieee_id><sourcerecordid>7060862</sourcerecordid><originalsourceid>FETCH-LOGICAL-i175t-504a88741fda9dec7e6379849c93aac832f380831e44df19031c90c9caf6fa043</originalsourceid><addsrcrecordid>eNpVkM1KAzEUhSMiKLUvoJu8wNSbSTpJlqX4B62KVrclZm7alMxMSTItvr0Vi-Dq8MH5zuIQcsVgxBjom6eP-eJtVAITIwkVqKo8IUMtFRNSa1FCWZ7-Y67PyTClDQAwKcdVpS5IP6k3fcrmMyDddSGbFdIat9jW2Gaa9j7btW9X1K5NNDZj9Cl7m2jn6MvrZE5dF2no9n_uNnaraJrmxzl0mj5kXwTcYaAR00E2rcV0Sc6cCQmHxxyQ97vbxfShmD3fP04ns8IzOc7FGIRRSgrmaqNrtBIrLrUS2mpujFW8dFyB4gyFqB3TwJnVYLU1rnIGBB-Q699dj4jLbfSNiV_L41n8GxgcX_w</addsrcrecordid><sourcetype>Publisher</sourcetype><iscdi>true</iscdi><recordtype>conference_proceeding</recordtype></control><display><type>conference_proceeding</type><title>Adjustable voltage dependent switching characteristics of PRAM for low voltage programming of multi-level resistances</title><source>IEEE Electronic Library (IEL) Conference Proceedings</source><creator>Gwihyun Kim ; Sanghyun Lee ; Seungwoo Hong ; Seung Jae Baik ; Hori, Hideki ; Dong-ho Ahn</creator><creatorcontrib>Gwihyun Kim ; Sanghyun Lee ; Seungwoo Hong ; Seung Jae Baik ; Hori, Hideki ; Dong-ho Ahn</creatorcontrib><description>Low voltage programming of multi-level-cell phase change random access memory (MLC PRAM) is important for future low power high density applications of PRAM devices [1]. We have characterized voltage dependent resistance switching characteristics of PRAM devices with various voltage pulses, based on which a dual-pulse programming method is systematically proposed to demonstrate some principles of low voltage MLC programming. A microstructural model is also introduced to provide a comprehensive explanation of resistance swiching for various voltage pulses.</description><identifier>ISBN: 9781479942039</identifier><identifier>ISBN: 1479942030</identifier><identifier>EISBN: 9781479942022</identifier><identifier>EISBN: 1479942022</identifier><identifier>DOI: 10.1109/NVMTS.2014.7060862</identifier><language>eng</language><publisher>IEEE</publisher><subject>Low voltage ; microstructual model ; MLC PRAM ; Phase change random access memory ; Programming ; programming pulse ; reset initialization ; Resistance ; Switches ; Threshold voltage ; Voltage control</subject><ispartof>2014 14th Annual Non-Volatile Memory Technology Symposium (NVMTS), 2014, p.1-3</ispartof><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://ieeexplore.ieee.org/document/7060862$$EHTML$$P50$$Gieee$$H</linktohtml><link.rule.ids>309,310,780,784,789,790,2058,27925,54920</link.rule.ids><linktorsrc>$$Uhttps://ieeexplore.ieee.org/document/7060862$$EView_record_in_IEEE$$FView_record_in_$$GIEEE</linktorsrc></links><search><creatorcontrib>Gwihyun Kim</creatorcontrib><creatorcontrib>Sanghyun Lee</creatorcontrib><creatorcontrib>Seungwoo Hong</creatorcontrib><creatorcontrib>Seung Jae Baik</creatorcontrib><creatorcontrib>Hori, Hideki</creatorcontrib><creatorcontrib>Dong-ho Ahn</creatorcontrib><title>Adjustable voltage dependent switching characteristics of PRAM for low voltage programming of multi-level resistances</title><title>2014 14th Annual Non-Volatile Memory Technology Symposium (NVMTS)</title><addtitle>NVMTS</addtitle><description>Low voltage programming of multi-level-cell phase change random access memory (MLC PRAM) is important for future low power high density applications of PRAM devices [1]. We have characterized voltage dependent resistance switching characteristics of PRAM devices with various voltage pulses, based on which a dual-pulse programming method is systematically proposed to demonstrate some principles of low voltage MLC programming. A microstructural model is also introduced to provide a comprehensive explanation of resistance swiching for various voltage pulses.</description><subject>Low voltage</subject><subject>microstructual model</subject><subject>MLC PRAM</subject><subject>Phase change random access memory</subject><subject>Programming</subject><subject>programming pulse</subject><subject>reset initialization</subject><subject>Resistance</subject><subject>Switches</subject><subject>Threshold voltage</subject><subject>Voltage control</subject><isbn>9781479942039</isbn><isbn>1479942030</isbn><isbn>9781479942022</isbn><isbn>1479942022</isbn><fulltext>true</fulltext><rsrctype>conference_proceeding</rsrctype><creationdate>2014</creationdate><recordtype>conference_proceeding</recordtype><sourceid>6IE</sourceid><recordid>eNpVkM1KAzEUhSMiKLUvoJu8wNSbSTpJlqX4B62KVrclZm7alMxMSTItvr0Vi-Dq8MH5zuIQcsVgxBjom6eP-eJtVAITIwkVqKo8IUMtFRNSa1FCWZ7-Y67PyTClDQAwKcdVpS5IP6k3fcrmMyDddSGbFdIat9jW2Gaa9j7btW9X1K5NNDZj9Cl7m2jn6MvrZE5dF2no9n_uNnaraJrmxzl0mj5kXwTcYaAR00E2rcV0Sc6cCQmHxxyQ97vbxfShmD3fP04ns8IzOc7FGIRRSgrmaqNrtBIrLrUS2mpujFW8dFyB4gyFqB3TwJnVYLU1rnIGBB-Q699dj4jLbfSNiV_L41n8GxgcX_w</recordid><startdate>201410</startdate><enddate>201410</enddate><creator>Gwihyun Kim</creator><creator>Sanghyun Lee</creator><creator>Seungwoo Hong</creator><creator>Seung Jae Baik</creator><creator>Hori, Hideki</creator><creator>Dong-ho Ahn</creator><general>IEEE</general><scope>6IE</scope><scope>6IL</scope><scope>CBEJK</scope><scope>RIE</scope><scope>RIL</scope></search><sort><creationdate>201410</creationdate><title>Adjustable voltage dependent switching characteristics of PRAM for low voltage programming of multi-level resistances</title><author>Gwihyun Kim ; Sanghyun Lee ; Seungwoo Hong ; Seung Jae Baik ; Hori, Hideki ; Dong-ho Ahn</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-i175t-504a88741fda9dec7e6379849c93aac832f380831e44df19031c90c9caf6fa043</frbrgroupid><rsrctype>conference_proceedings</rsrctype><prefilter>conference_proceedings</prefilter><language>eng</language><creationdate>2014</creationdate><topic>Low voltage</topic><topic>microstructual model</topic><topic>MLC PRAM</topic><topic>Phase change random access memory</topic><topic>Programming</topic><topic>programming pulse</topic><topic>reset initialization</topic><topic>Resistance</topic><topic>Switches</topic><topic>Threshold voltage</topic><topic>Voltage control</topic><toplevel>online_resources</toplevel><creatorcontrib>Gwihyun Kim</creatorcontrib><creatorcontrib>Sanghyun Lee</creatorcontrib><creatorcontrib>Seungwoo Hong</creatorcontrib><creatorcontrib>Seung Jae Baik</creatorcontrib><creatorcontrib>Hori, Hideki</creatorcontrib><creatorcontrib>Dong-ho Ahn</creatorcontrib><collection>IEEE Electronic Library (IEL) Conference Proceedings</collection><collection>IEEE Proceedings Order Plan All Online (POP All Online) 1998-present by volume</collection><collection>IEEE Xplore All Conference Proceedings</collection><collection>IEEE Electronic Library (IEL)</collection><collection>IEEE Proceedings Order Plans (POP All) 1998-Present</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Gwihyun Kim</au><au>Sanghyun Lee</au><au>Seungwoo Hong</au><au>Seung Jae Baik</au><au>Hori, Hideki</au><au>Dong-ho Ahn</au><format>book</format><genre>proceeding</genre><ristype>CONF</ristype><atitle>Adjustable voltage dependent switching characteristics of PRAM for low voltage programming of multi-level resistances</atitle><btitle>2014 14th Annual Non-Volatile Memory Technology Symposium (NVMTS)</btitle><stitle>NVMTS</stitle><date>2014-10</date><risdate>2014</risdate><spage>1</spage><epage>3</epage><pages>1-3</pages><isbn>9781479942039</isbn><isbn>1479942030</isbn><eisbn>9781479942022</eisbn><eisbn>1479942022</eisbn><abstract>Low voltage programming of multi-level-cell phase change random access memory (MLC PRAM) is important for future low power high density applications of PRAM devices [1]. We have characterized voltage dependent resistance switching characteristics of PRAM devices with various voltage pulses, based on which a dual-pulse programming method is systematically proposed to demonstrate some principles of low voltage MLC programming. A microstructural model is also introduced to provide a comprehensive explanation of resistance swiching for various voltage pulses.</abstract><pub>IEEE</pub><doi>10.1109/NVMTS.2014.7060862</doi><tpages>3</tpages></addata></record>
fulltext fulltext_linktorsrc
identifier ISBN: 9781479942039
ispartof 2014 14th Annual Non-Volatile Memory Technology Symposium (NVMTS), 2014, p.1-3
issn
language eng
recordid cdi_ieee_primary_7060862
source IEEE Electronic Library (IEL) Conference Proceedings
subjects Low voltage
microstructual model
MLC PRAM
Phase change random access memory
Programming
programming pulse
reset initialization
Resistance
Switches
Threshold voltage
Voltage control
title Adjustable voltage dependent switching characteristics of PRAM for low voltage programming of multi-level resistances
url http://sfxeu10.hosted.exlibrisgroup.com/loughborough?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-04T03%3A23%3A37IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-ieee_6IE&rft_val_fmt=info:ofi/fmt:kev:mtx:book&rft.genre=proceeding&rft.atitle=Adjustable%20voltage%20dependent%20switching%20characteristics%20of%20PRAM%20for%20low%20voltage%20programming%20of%20multi-level%20resistances&rft.btitle=2014%2014th%20Annual%20Non-Volatile%20Memory%20Technology%20Symposium%20(NVMTS)&rft.au=Gwihyun%20Kim&rft.date=2014-10&rft.spage=1&rft.epage=3&rft.pages=1-3&rft.isbn=9781479942039&rft.isbn_list=1479942030&rft_id=info:doi/10.1109/NVMTS.2014.7060862&rft.eisbn=9781479942022&rft.eisbn_list=1479942022&rft_dat=%3Cieee_6IE%3E7060862%3C/ieee_6IE%3E%3Cgrp_id%3Ecdi_FETCH-LOGICAL-i175t-504a88741fda9dec7e6379849c93aac832f380831e44df19031c90c9caf6fa043%3C/grp_id%3E%3Coa%3E%3C/oa%3E%3Curl%3E%3C/url%3E&rft_id=info:oai/&rft_id=info:pmid/&rft_ieee_id=7060862&rfr_iscdi=true