Effect of doping in the current voltage characteristics of organic diodes

We analyze the effects of doping, traps and other defects on the electronic properties of organic/polymeric diodes. We detect the presence of dopant atoms and traps in the semiconductor in experimental current density-voltage (j-V) curves by the comparison with numerical j-V curves. The transport eq...

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Bibliographic Details
Main Authors: Lopez Varo, P., Jimenez Tejada, J. A., Lopez Villanueva, J. A., Deen, M. J.
Format: Conference Proceeding
Language:English
Subjects:
Current density
Doping
dopping effects
Electric fields
Impurities
injection of charge
Low voltage
Mathematical model
modelling
Organic Diodes
Semiconductor diodes
transport of charge
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Summary:We analyze the effects of doping, traps and other defects on the electronic properties of organic/polymeric diodes. We detect the presence of dopant atoms and traps in the semiconductor in experimental current density-voltage (j-V) curves by the comparison with numerical j-V curves. The transport equations are solved by means of the Lambert-W-function. The key parameter in the procedure is the boundary value for the free carrier density at the metal-organic interface.
ISSN:2163-4971
2643-1300
DOI:10.1109/CDE.2015.7087510