A new dependency model based testability analyzer

• Main Authors: Chujen Lin, Hayes, L., Malais, A., Kelley, B., Prasad, P.
• Format: Conference Proceeding
• Language: English
• Subjects: Algorithm design and analysis; Automatic testing; Built-in self-test; Circuit faults; Circuit testing; Electronic equipment testing; Fault detection; Fault trees; Performance evaluation; System testing
• ISSN: 1088-7725; 1558-4550
• DOI: 10.1109/AUTEST.1998.713442

This paper describes the development of a testability analysis tool called ADMA. The approach used in ADMA is based on use of dependency models. Dependency models are the basis of several important products for testability analysis. What makes ADMA different from existing testability analysis tools is its capability to use multiple analysis algorithms and its user-friendly report format. The rationale behind the decision to support multiple algorithms is that an algorithm may perform better for certain circuits than other algorithms ADMA allows users to compare the results of different analysis side by side. ADMA provides concise reports of different formats for different types of users, such as executives, system designers, test engineers, and dependency modelers. Thus, users can focus on the aspects that are of interest to them. The subject paper gives an overview of the ADMA, emphasizing the fundamental advances represented by ADMA. The paper also describes how this tool integrates with the Automatic Dependency Model Generator, and with the Automatic Built-in Test generator. The paper does not focus on ADMA as a product, but more on how it generally extends current dependency mode-based tools.