Investigation of gated field emission array of high resistance tips for improving brightness uniformity of FED

The well known idea to achieve surface uniformity of FED brightness by the way of including of megaohmic resistor in electric circuit of each tip require of special process of high resistive layer deposition and additional lithography procedure. Also, it is known FED development program which try to...

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Bibliographic Details
Main Author: Chubun, N.
Format: Conference Proceeding
Language:English
Subjects:
Brightness
Cathodes
Circuit testing
Driver circuits
Electric resistance
Lithography
Manufacturing
Materials testing
Resistors
Surface resistance
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Summary:The well known idea to achieve surface uniformity of FED brightness by the way of including of megaohmic resistor in electric circuit of each tip require of special process of high resistive layer deposition and additional lithography procedure. Also, it is known FED development program which try to circumvent these difficulties by the way of complicated driver circuits instead of resistive layer. In this work in order to simplify the technology we have investigated possibility to manufacture field emission array cathodes with high resistive material of emission tips and have tested its emission properties and level of brightness uniformity within real FEDs.
DOI:10.1109/IVMC.1998.728626