Toward understanding "Iddq-only" fails

This paper investigates the important question of whether or not Iddq-only fails are "bad" and should be rejected during testing. The analysis is based on the Sematech experiment results and employs current signature-based testing.

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Bibliographic Details
Main Authors: Gattiker, A.E., Maly, W.
Format: Conference Proceeding
Language:English
Subjects:
Application specific integrated circuits
Circuit testing
Delay
Histograms
Integrated circuit modeling
Integrated circuit testing
Manufacturing
Packaging
Voltage
Wafer scale integration
Online Access:Request full text
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Description
Summary:This paper investigates the important question of whether or not Iddq-only fails are "bad" and should be rejected during testing. The analysis is based on the Sematech experiment results and employs current signature-based testing.
ISSN:1089-3539
2378-2250
DOI:10.1109/TEST.1998.743150