Study of the impact of dielectric aging on coplanar waveguide performance

In this paper, we study the impact of electrical and thermal stress on line loss and characteristic impedance of a CoPlanar Waveguides (CPWs). The de-rating of the line propagation constants and impedance characteristic are analyzed and discussed with respect to the stress level applied to the diele...

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Bibliographic Details
Main Authors: Anh Phuong Nguyen, Luders, Ulrike, Voiron, Frederic
Format: Conference Proceeding
Language:English
Subjects:
characteristic impedance
charges
Constants
Coplanar waveguide (CPW)
Coplanar waveguides
Dielectric constant
Dielectric properties
dielectric stress
Dielectrics
Impedance
line loss
mobile ions
On-line systems
Silicon
Stress
Substrates
Temperature measurement
Workshops
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Description
Summary:In this paper, we study the impact of electrical and thermal stress on line loss and characteristic impedance of a CoPlanar Waveguides (CPWs). The de-rating of the line propagation constants and impedance characteristic are analyzed and discussed with respect to the stress level applied to the dielectric. The physical mechanisms leading to dielectric properties variation is explained.
ISSN:2374-8036
DOI:10.1109/IIRW.2015.7437078