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Objects and methods of on-line testing: Main requirements and perspectives of development
This paper is devoted to the development of objects and methods in on-line testing. Requirements imposed to computer systems and on-line testing of their digital components are analyzed in efficiency of use of resources and in restriction of the hidden processes. The low level of execution of these...
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| creator | Drozd, A. Drozd, J. Antoshchuk, S. Nikul, V. Al-dhabi, M. |
| description | This paper is devoted to the development of objects and methods in on-line testing. Requirements imposed to computer systems and on-line testing of their digital components are analyzed in efficiency of use of resources and in restriction of the hidden processes. The low level of execution of these requirements in the modern computer systems and in circuits of on-line testing because of domination of the array structures relating to the bottom level of resource development is shown. Abbreviation of array structures by conversion of the modern computer systems to multithreaded systems of the bitwise pipelines increasing the level in execution of requirements is offered. The methods of their on-line testing estimating value of result and its error are considered. |
| doi_str_mv | 10.1109/EWDTS.2016.7807750 |
| format | conference_proceeding |
| fullrecord | <record><control><sourceid>ieee_CHZPO</sourceid><recordid>TN_cdi_ieee_primary_7807750</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><ieee_id>7807750</ieee_id><sourcerecordid>7807750</sourcerecordid><originalsourceid>FETCH-LOGICAL-c139t-6df867ac770668738ec90d44a8645b48c22a915dfde6ef005f5f80cbbe94c0bd3</originalsourceid><addsrcrecordid>eNotkMtOwzAUBQ0SEqX0B2DjH0i4TuIXO1RaQCrqgiJgVTn2NbjKizhU4u8pkNXZzMziEHLBIGUM9NXi5XbzlGbARCoVSMnhiJwxDhpA6Jwdk0lWyCyRgr2eklmMO4ADy7jO2IS8rcsd2iFS0zha4_DRukhbT9smqUKDdMA4hOb9mj6a0NAeP79CjzU2o9FhH7uDH_b4pzncY9V2v8A5OfGmijgbd0qel4vN_D5Zre8e5jerxLJcD4lwXglprJQghJK5QqvBFYVRouBloWyWGc248w4FegDuuVdgyxJ1YaF0-ZRc_ncDIm67PtSm_96OT-Q_aZFT8A</addsrcrecordid><sourcetype>Publisher</sourcetype><iscdi>true</iscdi><recordtype>conference_proceeding</recordtype></control><display><type>conference_proceeding</type><title>Objects and methods of on-line testing: Main requirements and perspectives of development</title><source>IEEE Xplore All Conference Series</source><creator>Drozd, A. ; Drozd, J. ; Antoshchuk, S. ; Nikul, V. ; Al-dhabi, M.</creator><creatorcontrib>Drozd, A. ; Drozd, J. ; Antoshchuk, S. ; Nikul, V. ; Al-dhabi, M.</creatorcontrib><description>This paper is devoted to the development of objects and methods in on-line testing. Requirements imposed to computer systems and on-line testing of their digital components are analyzed in efficiency of use of resources and in restriction of the hidden processes. The low level of execution of these requirements in the modern computer systems and in circuits of on-line testing because of domination of the array structures relating to the bottom level of resource development is shown. Abbreviation of array structures by conversion of the modern computer systems to multithreaded systems of the bitwise pipelines increasing the level in execution of requirements is offered. The methods of their on-line testing estimating value of result and its error are considered.</description><identifier>EISSN: 2472-761X</identifier><identifier>EISBN: 1509006931</identifier><identifier>EISBN: 9781509006939</identifier><identifier>DOI: 10.1109/EWDTS.2016.7807750</identifier><language>eng</language><publisher>IEEE</publisher><subject>Circuit faults ; Computers ; Pipeline processing ; Pipelines ; Registers ; Testing ; Throughput</subject><ispartof>2016 IEEE East-West Design & Test Symposium (EWDTS), 2016, p.1-5</ispartof><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c139t-6df867ac770668738ec90d44a8645b48c22a915dfde6ef005f5f80cbbe94c0bd3</citedby></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://ieeexplore.ieee.org/document/7807750$$EHTML$$P50$$Gieee$$H</linktohtml><link.rule.ids>309,310,780,784,789,790,23930,23931,25140,27925,54555,54932</link.rule.ids><linktorsrc>$$Uhttps://ieeexplore.ieee.org/document/7807750$$EView_record_in_IEEE$$FView_record_in_$$GIEEE</linktorsrc></links><search><creatorcontrib>Drozd, A.</creatorcontrib><creatorcontrib>Drozd, J.</creatorcontrib><creatorcontrib>Antoshchuk, S.</creatorcontrib><creatorcontrib>Nikul, V.</creatorcontrib><creatorcontrib>Al-dhabi, M.</creatorcontrib><title>Objects and methods of on-line testing: Main requirements and perspectives of development</title><title>2016 IEEE East-West Design & Test Symposium (EWDTS)</title><addtitle>EWDTS</addtitle><description>This paper is devoted to the development of objects and methods in on-line testing. Requirements imposed to computer systems and on-line testing of their digital components are analyzed in efficiency of use of resources and in restriction of the hidden processes. The low level of execution of these requirements in the modern computer systems and in circuits of on-line testing because of domination of the array structures relating to the bottom level of resource development is shown. Abbreviation of array structures by conversion of the modern computer systems to multithreaded systems of the bitwise pipelines increasing the level in execution of requirements is offered. The methods of their on-line testing estimating value of result and its error are considered.</description><subject>Circuit faults</subject><subject>Computers</subject><subject>Pipeline processing</subject><subject>Pipelines</subject><subject>Registers</subject><subject>Testing</subject><subject>Throughput</subject><issn>2472-761X</issn><isbn>1509006931</isbn><isbn>9781509006939</isbn><fulltext>true</fulltext><rsrctype>conference_proceeding</rsrctype><creationdate>2016</creationdate><recordtype>conference_proceeding</recordtype><sourceid>6IE</sourceid><recordid>eNotkMtOwzAUBQ0SEqX0B2DjH0i4TuIXO1RaQCrqgiJgVTn2NbjKizhU4u8pkNXZzMziEHLBIGUM9NXi5XbzlGbARCoVSMnhiJwxDhpA6Jwdk0lWyCyRgr2eklmMO4ADy7jO2IS8rcsd2iFS0zha4_DRukhbT9smqUKDdMA4hOb9mj6a0NAeP79CjzU2o9FhH7uDH_b4pzncY9V2v8A5OfGmijgbd0qel4vN_D5Zre8e5jerxLJcD4lwXglprJQghJK5QqvBFYVRouBloWyWGc248w4FegDuuVdgyxJ1YaF0-ZRc_ncDIm67PtSm_96OT-Q_aZFT8A</recordid><startdate>201610</startdate><enddate>201610</enddate><creator>Drozd, A.</creator><creator>Drozd, J.</creator><creator>Antoshchuk, S.</creator><creator>Nikul, V.</creator><creator>Al-dhabi, M.</creator><general>IEEE</general><scope>6IE</scope><scope>6IL</scope><scope>CBEJK</scope><scope>RIE</scope><scope>RIL</scope></search><sort><creationdate>201610</creationdate><title>Objects and methods of on-line testing: Main requirements and perspectives of development</title><author>Drozd, A. ; Drozd, J. ; Antoshchuk, S. ; Nikul, V. ; Al-dhabi, M.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c139t-6df867ac770668738ec90d44a8645b48c22a915dfde6ef005f5f80cbbe94c0bd3</frbrgroupid><rsrctype>conference_proceedings</rsrctype><prefilter>conference_proceedings</prefilter><language>eng</language><creationdate>2016</creationdate><topic>Circuit faults</topic><topic>Computers</topic><topic>Pipeline processing</topic><topic>Pipelines</topic><topic>Registers</topic><topic>Testing</topic><topic>Throughput</topic><toplevel>online_resources</toplevel><creatorcontrib>Drozd, A.</creatorcontrib><creatorcontrib>Drozd, J.</creatorcontrib><creatorcontrib>Antoshchuk, S.</creatorcontrib><creatorcontrib>Nikul, V.</creatorcontrib><creatorcontrib>Al-dhabi, M.</creatorcontrib><collection>IEEE Electronic Library (IEL) Conference Proceedings</collection><collection>IEEE Proceedings Order Plan All Online (POP All Online) 1998-present by volume</collection><collection>IEEE Xplore All Conference Proceedings</collection><collection>IEEE Xplore (Online service)</collection><collection>IEEE Proceedings Order Plans (POP All) 1998-Present</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Drozd, A.</au><au>Drozd, J.</au><au>Antoshchuk, S.</au><au>Nikul, V.</au><au>Al-dhabi, M.</au><format>book</format><genre>proceeding</genre><ristype>CONF</ristype><atitle>Objects and methods of on-line testing: Main requirements and perspectives of development</atitle><btitle>2016 IEEE East-West Design & Test Symposium (EWDTS)</btitle><stitle>EWDTS</stitle><date>2016-10</date><risdate>2016</risdate><spage>1</spage><epage>5</epage><pages>1-5</pages><eissn>2472-761X</eissn><eisbn>1509006931</eisbn><eisbn>9781509006939</eisbn><abstract>This paper is devoted to the development of objects and methods in on-line testing. Requirements imposed to computer systems and on-line testing of their digital components are analyzed in efficiency of use of resources and in restriction of the hidden processes. The low level of execution of these requirements in the modern computer systems and in circuits of on-line testing because of domination of the array structures relating to the bottom level of resource development is shown. Abbreviation of array structures by conversion of the modern computer systems to multithreaded systems of the bitwise pipelines increasing the level in execution of requirements is offered. The methods of their on-line testing estimating value of result and its error are considered.</abstract><pub>IEEE</pub><doi>10.1109/EWDTS.2016.7807750</doi><tpages>5</tpages></addata></record> |
| fulltext | fulltext_linktorsrc |
| identifier | EISSN: 2472-761X |
| ispartof | 2016 IEEE East-West Design & Test Symposium (EWDTS), 2016, p.1-5 |
| issn | 2472-761X |
| language | eng |
| recordid | cdi_ieee_primary_7807750 |
| source | IEEE Xplore All Conference Series |
| subjects | Circuit faults Computers Pipeline processing Pipelines Registers Testing Throughput |
| title | Objects and methods of on-line testing: Main requirements and perspectives of development |
| url | http://sfxeu10.hosted.exlibrisgroup.com/loughborough?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2024-12-29T11%3A02%3A13IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-ieee_CHZPO&rft_val_fmt=info:ofi/fmt:kev:mtx:book&rft.genre=proceeding&rft.atitle=Objects%20and%20methods%20of%20on-line%20testing:%20Main%20requirements%20and%20perspectives%20of%20development&rft.btitle=2016%20IEEE%20East-West%20Design%20&%20Test%20Symposium%20(EWDTS)&rft.au=Drozd,%20A.&rft.date=2016-10&rft.spage=1&rft.epage=5&rft.pages=1-5&rft.eissn=2472-761X&rft_id=info:doi/10.1109/EWDTS.2016.7807750&rft.eisbn=1509006931&rft.eisbn_list=9781509006939&rft_dat=%3Cieee_CHZPO%3E7807750%3C/ieee_CHZPO%3E%3Cgrp_id%3Ecdi_FETCH-LOGICAL-c139t-6df867ac770668738ec90d44a8645b48c22a915dfde6ef005f5f80cbbe94c0bd3%3C/grp_id%3E%3Coa%3E%3C/oa%3E%3Curl%3E%3C/url%3E&rft_id=info:oai/&rft_id=info:pmid/&rft_ieee_id=7807750&rfr_iscdi=true |