A fuzzy logic method on IC lead-frame surface inspection

The inspection of lead-frame is important in semiconductor industry. During the production process, the quality control of lead-frame plays an important role. Here we introduce a method for inspection of contamination and plating quality of lead frame. The basic method of segmentation of interested...

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Bibliographic Details
Main Authors: Jimin Li, Weon-Geun Oh, Chang-Joon Park, Hyeon-Jin Kim
Format: Conference Proceeding
Language:English
Subjects:
Computer science
Fuzzy logic
Image processing
Inspection
Laboratories
Lead compounds
Pattern recognition
Photonic integrated circuits
Production
Shape
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Summary:The inspection of lead-frame is important in semiconductor industry. During the production process, the quality control of lead-frame plays an important role. Here we introduce a method for inspection of contamination and plating quality of lead frame. The basic method of segmentation of interested lead surface into five classes is discussed based on the samples supplied from IC manufacturing company. A two-stage inspection method is introduced based on the basic five classes. The discussion of the system realization and experimental results show the idea.
ISSN:1098-7584
DOI:10.1109/FUZZY.1999.793109