Vce as early indicator of IGBT module failure mode

A double point monitoring concept of the on-state voltage is presented as a means to identify the failure mode early in a power module lifetime. The monitoring approach is carried out in a simple accelerated test setup, however, it is argued that the concepts should be possible in field. Additionall...

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Bibliographic Details
Main Authors: Pedersen, Kristian Bonderup, Kristensen, Peter Kjar, Pedersen, Kjeld, Uhrenfeldt, Christian, Munk-Nielsen, Stig
Format: Conference Proceeding
Language:English
Subjects:
Bond wire fatigue
Degradation
failure mode
IGBT modules
Insulated gate bipolar transistors
Life estimation
Metallization
Monitoring
on-state voltage
power cycling
Resistance
Wires
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Description
Summary:A double point monitoring concept of the on-state voltage is presented as a means to identify the failure mode early in a power module lifetime. The monitoring approach is carried out in a simple accelerated test setup, however, it is argued that the concepts should be possible in field. Additionally, by carrying out the monitoring in calibration conditions it is shown that it is possible to identify the fracture rate of the bond wire fatigue failure mechanism. The curve shape of the degradation rate is in accordance with expected fracture theory.
ISSN:1938-1891
DOI:10.1109/IRPS.2017.7936371