Extension of power supply impedance emulation method on ATE for multiple power domain

Mismatch of power supply integrity between an ATE and a customer board in semiconductor test can lead to test failures such as overkills and underkills. A technique is required to control the power supply impedance of an ATE by feedback control using compensation current injection so that it emulate...

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Bibliographic Details
Main Authors: Terao, Naoki, Nakura, Toru, Ishida, Masahiro, Ikeno, Rimon, Kusaka, Takashi, Iizuka, Tetsuya, Asada, Kunihiro
Format: Conference Proceeding
Language:English
Subjects:
Emulation
Impedance
Logic gates
Pins
Power supplies
Testing
Time-domain analysis
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Summary:Mismatch of power supply integrity between an ATE and a customer board in semiconductor test can lead to test failures such as overkills and underkills. A technique is required to control the power supply impedance of an ATE by feedback control using compensation current injection so that it emulates the impedance of a customer board, eliminating test failures coming from the impedance difference between the two environment. This paper discusses an extension theorem for a multiple power domain with mutual interference, such as a SIMO. Simulation results showed very good agreement between our emulated ATE and the customer board power supply noise waveforms.
ISSN:1558-1780
DOI:10.1109/ETS.2017.7968210