Automatic equipment for testing of complex multiparametric intelligent devices

This paper describes the structure and principles of automatic equipment for testing of complex multiparametric intelligent devices.

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Bibliographic Details
Main Authors: Gorchakovsky, A., Evstratko, V., Kamyshnikov, A., Kamyshnikova, A., Mishurov, A., Panko, S., Sukhotin, V.
Format: Conference Proceeding
Language:English
Subjects:
ATE
Automated test equipment
Electronic mail
HTE
intelligent devices
Physics
Process control
Servers
Software
Testing
testing of complex multiparametric devices
Online Access:Request full text
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Description
Summary:This paper describes the structure and principles of automatic equipment for testing of complex multiparametric intelligent devices.
ISSN:2380-6516
DOI:10.1109/SIBCON.2017.7998439