Reusable test environments for digital designs

The paper presents a methodology for reusing test environment components that is currently in use by design teams at Texas Instruments. It is a methodology that has proven itself over a period of years, resulting in shorter design cycle times and more capable products. There are problematic areas cu...

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Bibliographic Details
Main Authors: Bowers, R.W., McKinney, M.D.
Format: Conference Proceeding
Language:English
Subjects:
Application specific integrated circuits
Automatic testing
Design engineering
Hardware design languages
Instruments
Product design
Senior members
Software libraries
Strontium
System testing
Online Access:Request full text
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Summary:The paper presents a methodology for reusing test environment components that is currently in use by design teams at Texas Instruments. It is a methodology that has proven itself over a period of years, resulting in shorter design cycle times and more capable products. There are problematic areas currently being addressed, notable in the area of automated generation of test environment netlists. However, even with the problems, the methodology has been deemed useful and worthy of its construction.
DOI:10.1109/VIUF.1999.801969