Practical implementation of defect-oriented testing for a mixed-signal class-D amplifier

This paper describes the flow of defect-oriented testing from beginning to end, based on the industrial test development for a commercial mixed-signal class-D amplifier. A software tool called DOTSS (Defect-Oriented Test Simulation System) was used to perform the fault simulations. The greatest bene...

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Bibliographic Details
Main Authors: Beurze, R.H., Xing, Y., van Kleef, R., Tangelder, R.J.W.T., Engin, N.
Format: Conference Proceeding
Language:English
Subjects:
Circuit faults
Circuit testing
High power amplifiers
Integrated circuit testing
Niobium
Power amplifiers
Power generation
Pulse amplifiers
Semiconductor device testing
Voltage
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Summary:This paper describes the flow of defect-oriented testing from beginning to end, based on the industrial test development for a commercial mixed-signal class-D amplifier. A software tool called DOTSS (Defect-Oriented Test Simulation System) was used to perform the fault simulations. The greatest benefit of using defect-oriented testing turns out to be that it gives more insight in the underlying fault mechanisms. This information can be used to generate complementary tests or to take design-for-testability measures to achieve a high fault coverage.
DOI:10.1109/ETW.1999.804205