Towards a standard for embedded core test: an example

Integrated circuits are increasingly designed by embedding pre-designed reusable cores. IEEE P1500 Standard for Embedded Core Test (SECT) is a standard-under-development that aims at improving ease of reuse and facilitating interoperability with respect to the test of such core-based ICs, especially...

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Bibliographic Details
Main Authors: Marinissen, E.J., Zorian, Y., Kapur, R., Taylor, T., Whetsel, L.
Format: Conference Proceeding
Language:English
Subjects:
Circuit faults
Circuit testing
Crosstalk
Hardware
Instruments
Integrated circuit interconnections
Manufacturing
Standardization
Standards development
System testing
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Description
Summary:Integrated circuits are increasingly designed by embedding pre-designed reusable cores. IEEE P1500 Standard for Embedded Core Test (SECT) is a standard-under-development that aims at improving ease of reuse and facilitating interoperability with respect to the test of such core-based ICs, especially if they contain cores from different sources. This paper briefly describes IEEE P1500, and illustrates through a simplified example its dual compliance concept, its Scalable Hardware Architecture, and its Core Test Language. This paper provides a preliminary, unapproved view on IEEE P1500. The standard is still under development, and this paper only reflects the view of five active participants of the Standardization Committee on its current status.
ISSN:1089-3539
2378-2250
DOI:10.1109/TEST.1999.805786