Accelerated degradation testing of driver IC based on constant humidity stress

In this paper, we performed accelerated degradation testing (ADT) of a certain type of driver IC under different humidity stress levels. We keep the drivers in storage under same temperature but different humidity; measure the determined sensitive parameter of the driver with fixed time interval, th...

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Bibliographic Details
Main Authors: ZhaoXi Wu, ZhongWen Qiu, Jun Luo, JianRong Cai
Format: Conference Proceeding
Language:English
Subjects:
Degradation
Humidity
Integrated circuits
Life estimation
Reliability
Stress
Testing
Online Access:Request full text
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Summary:In this paper, we performed accelerated degradation testing (ADT) of a certain type of driver IC under different humidity stress levels. We keep the drivers in storage under same temperature but different humidity; measure the determined sensitive parameter of the driver with fixed time interval, then model the degradation path to obtain the pseudo-failure lifetime. Finally, we analyze the test data by using a power-law equation, extrapolate storage lifetime of the driver IC under normal temperature and humidity stress level.
ISSN:1946-1550
DOI:10.1109/IPFA.2017.8060114