A 2.56-GHz SEU Radiation Hard LC -Tank VCO for High-Speed Communication Links in 65-nm CMOS Technology

This paper presents a radiation tolerant phase-locked loop CMOS application-specified integrated circuit with an optimized voltage controlled oscillator (VCO) for single-event upsets (SEUs). The circuit is designed for high-energy particle physics experiments for low-jitter clock generation and cloc...

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Bibliographic Details
Published in:IEEE transactions on nuclear science 2018-01, Vol.65 (1), p.407-412
Main Authors: Prinzie, Jeffrey, Christiansen, Jorgen, Moreira, Paulo, Steyaert, Michiel, Leroux, Paul
Format: Article
Language:English
Subjects:
Circuit design
Clock recovery
CMOS
Energy transfer
Heavy ions
jitter
Linear energy transfer (LET)
Particle physics
Phase locked loops
phase-locked loop (PLL)
Physics
Radiation
radiation effects
Sensitivity
single-event upsets (SEUs)
Technology
Tuning
Varactors
Vibration
Voltage control
voltage controlled oscillator (VCO)
Voltage controlled oscillators
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Description
Summary:This paper presents a radiation tolerant phase-locked loop CMOS application-specified integrated circuit with an optimized voltage controlled oscillator (VCO) for single-event upsets (SEUs). The circuit is designed for high-energy particle physics experiments for low-jitter clock generation and clock recovery. An optimal tuning strategy of the VCO is presented that minimizes the cross section and the SEU sensitivity of the oscillator. The circuit is processed in a 65-nm CMOS technology and has been irradiated with heavy ions with a linear energy transfer between 10 to 69.2 MeV.cm 2 /mg. A comparison has been made with a conventional oscillator which proves a significant improvement in SEU sensitivity.
ISSN:0018-9499
1558-1578
DOI:10.1109/TNS.2017.2764501