Electrical, dielectric and structural characterization of nickel ferrite films for thin film electronic applications

In this paper, we present detailed electrical, dielectric and structural analysis of nickel ferrite thin film deposited by spin coating technique. Films were characterized by the impedance spectroscopy measurements, four-point Hall effect measurements, XRD analysis and dielectric measurements. Low-c...

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Bibliographic Details
Main Authors: Sredojevic, Stefan, Kovacevic, Nikola, Miseljic, Djordje
Format: Conference Proceeding
Language:English
Subjects:
Conductivity
Dielectrics
Ferrites
Grain boundaries
Impedance
Nickel
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Summary:In this paper, we present detailed electrical, dielectric and structural analysis of nickel ferrite thin film deposited by spin coating technique. Films were characterized by the impedance spectroscopy measurements, four-point Hall effect measurements, XRD analysis and dielectric measurements. Low-cost fabrication technique, as well as good properties of the film, (smooth, crack free surface, uniform thickness) makes them good candidates for thin film electronic applications.
ISSN:2472-761X
DOI:10.1109/EWDTS.2017.8110054