Optical characterization of surface oxide in Ge-Sb-Te alloy films

Ge-Sb-Te alloy film phase change recording layer can deteriorate the cyclability and it can be reduced with the nitrogen treatment. It is reported that the jitter characteristics over read-write cycle has been greatly improved. In the present research, the evolution of the surface oxide in Ge-Sb-Te...

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Main Authors: Sang Youl Kim, Sang June Kim, Tae Hee Jeong, Jeong Woo Park, Cheong Yeon, Hun Seo
Format: Conference Proceeding
Language:English
Subjects:
Amorphous materials
Crystallization
Nitrogen
Optical films
Optical recording
Optical refraction
Optical variables control
Reflectivity
Refractive index
Surface contamination
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creator Sang Youl Kim
Sang June Kim
Tae Hee Jeong
Jeong Woo Park
Cheong Yeon
Hun Seo
description Ge-Sb-Te alloy film phase change recording layer can deteriorate the cyclability and it can be reduced with the nitrogen treatment. It is reported that the jitter characteristics over read-write cycle has been greatly improved. In the present research, the evolution of the surface oxide in Ge-Sb-Te alloys including nitrogen doped ones is investigated. The variation of the observed reflectivity spectra is compared with the calculated one.
doi_str_mv 10.1109/CLEOPR.1999.811479
format conference_proceeding
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ispartof Technical Digest. CLEO/Pacific Rim '99. Pacific Rim Conference on Lasers and Electro-Optics (Cat. No.99TH8464), 1999, Vol.2, p.379-380 vol.2
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source IEEE Electronic Library (IEL) Conference Proceedings
subjects Amorphous materials
Crystallization
Nitrogen
Optical films
Optical recording
Optical refraction
Optical variables control
Reflectivity
Refractive index
Surface contamination
title Optical characterization of surface oxide in Ge-Sb-Te alloy films
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