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The following topics are dealt with: radiation hardening (electronics); proton effects; radiation effects; space vehicle electronics; integrated circuit testing; field programmable gate arrays; SRAM chips; microprocessor chips; operational amplifiers; wide band gap semiconductors.

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Bibliographic Details
Format: Conference Proceeding
Language:English
Online Access:Request full text
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Description
Summary:The following topics are dealt with: radiation hardening (electronics); proton effects; radiation effects; space vehicle electronics; integrated circuit testing; field programmable gate arrays; SRAM chips; microprocessor chips; operational amplifiers; wide band gap semiconductors.
ISSN:2154-0535
DOI:10.1109/NSREC.2017.8115425