A method for characterizing resistive and dielectric materials in VHF using the detection by integration principle

This paper describes a simple and new process for characterization of resistive and dielectric materials in VHF range. We have developed a computer program which permits to simulate the analogical function used in detection by integration measurement. The obtained results show a good measurement acc...

Full description

Saved in:
Bibliographic Details
Main Authors: Halheit, H., Haraoubia, B.
Format: Conference Proceeding
Language:English
Subjects:
Capacitors
Conductors
Couplers
Dielectric materials
Dielectric measurements
Frequency measurement
Material properties
Permittivity
Phase detection
Testing
Online Access:Request full text
Tags: Add Tag
No Tags, Be the first to tag this record!
Description
Summary:This paper describes a simple and new process for characterization of resistive and dielectric materials in VHF range. We have developed a computer program which permits to simulate the analogical function used in detection by integration measurement. The obtained results show a good measurement accuracy comparing to the analogical method.
DOI:10.1109/MIAME.1999.827802